Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa₂Cu₃O₇ thin films

F. Berberich and H. Graafsma

ESRF, 38043 Grenoble Cedex 9, France

B. Rousseau, A. Canizares, R. Ramy Ratiarison, N. Raimboux, and P. Simon

CNRS - CRMHT, 45071 Orléans, France

P. Odier

CNRS-Laboratoire de Cristallographie, 38402 Grenoble, France

N. Mestres, T. Puig, and X. Obradors

ICMAB-CSIC, Campus de la Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain

A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa₂Cu₃O₆₊_x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO₃ substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films

Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa₂Cu₃O₇ thin films