Editor-in-Chief: |
Robert A. Laudise |
Associate Editors: |
Shigeyuki Somiya Heinrich J. Wollenberger |
Abstracts for January 1997 Journal of Materials Research
Vol. 12, No. 1
COMMUNICATIONS
The intercalation
of Ar into C60 films
G.E. Gadd, P.J. Evans, S. Moricca, M. James, pp. 1-4
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Text
Martensite transition
in rapidly solidified Ti3Al-2Nb alloy
R. Xu, Y.Y. Cui, D.M. Xu, D. Li, Q.C. Li, Z.Q. Hu, pp. 5-8
Full
Text
The cross-over of
preferred orientation in TiN film growth: A real time x-ray scattering
study
J.H. Je, D.Y. Noh, H.K. Kim, K.S. Liang, pp. 9-12
Full
Text
Stabilization of
lead lithium iron tungstate with adding barium titanate
C-H. Lu, B-K. Fang, pp. 13-16
Full
Text
Electroluminescence
from amorphous-silicon-based switching devices
V.A. Kuznetsov, D. Haneman, pp. 17-20
Full
Text
ARTICLES
Influence of powder
characteristics on the properties of green compacts of Bi-2212
powders
D.W. Yuan, M.D. Aesoph, J. Kajuch, pp. 21-27
Full
Text
X-ray diffraction
line broadening effects in MBa2Cu3O7-delta (M = Y, Gd) thin films
P. Scardi, F.C. Matacotta, V.I. Dediu, L. Correra, pp. 28-37
Full
Text
Precipitate size
refinement by CeO2 and Y2BaCuO5 additions in directionally solidified
YBa2Cu3O7
N. Vilalta, F. Sandiumenge, S. Piñol, X. Obradors, pp.
38-46
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Text
Oxygen content and
inhomogeneity effects on the electrical properties of YBa2Cu3Oy
thin films
R. Aguiar, F. Sánchez, M. Varela, pp. 47-53
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Text
Micromechanical and
tribological characterization of doped single-crystal silicon
and polysilicon films for microelectromechanical systems devices
B. Bhushan, X. Li, pp. 54-63
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Text
Low-load indentation
behavior of HfN thin films deposited by reactive rf sputtering
R. Nowak, C.L. Li, S. Maruno, pp. 64-69
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Text
Comparison of C2F6
and FASi-4 as fluorine dopant sources in plasma enhanced chemical
vapor deposition fluorinated silica glass films
W.S. Yoo, R. Swope, B. Sparks, D. Mordo, pp. 70-74
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Text
Surface short-range
ordering of Cu3Au above Tc in the topmost 80 A of an (001) face
M. Kimura, J.B. Cohen, S. Chandavarkar, K. Liang, pp. 75-82
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Text
Fractal morphologies
from decomposition of Fe-Ni-Invar alloys
Q. Li, A. Wiedenmann, H. Wollenberger, pp. 83-92
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Text
Embedded atom calculations
of unstable stacking fault energies and surface energies in intermetallics
D. Farkas, S.J. Zhou, C. Vailhé, B. Mutasa, J. Panova,
pp. 93-99
Full
Text
X-ray photoelectron
spectroscopy studies of silicon suboxides obtained by the sol-gel
method
S. Santucci, E. Cordeschi, L. Lozzi, M. Passacantando, P. Picozzi,
L. Mancinelli degli Esposti, pp. 100-105
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Text
Fatigue in hydrazone-based
xerographic photoreceptors--Effect of ultraviolet irradiation
C.K.H. Wong, Y.C. Chan, J. Pfleger, Y.W. Lam, K.M. Leung, D.S.
Chiu, pp. 106-112
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Text
Copper-boron nitride
interaction in hot-pressed ceramics
M. Hubácek, T. Sato, M. Ueki, pp. 113-118
Full
Text
Epitaxial dependence
of the melting behavior of In nanoparticles embedded in Al matrices
H.W. Sheng, G. Ren, L.M. Peng, Z.Q. Hu, K. Lu, pp. 119-123
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Text
Finite-size corrections
for the Johnson-Mehl-Avrami-Kolmogorov equation
L.E. Levine, K. Lakshmi Narayan, K.F. Kelton, pp. 124-132
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Text
Reactive phase formation
in sputter-deposited Ni/Al multilayer thin films
K. Barmak, C. Michaelsen, G. Lucadamo, pp. 133-146
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Text
Response of silicon
carbide to high-intensity laser irradiation in a high-pressure
inert gas atmosphere
L.Y. Sadler, M. Shamsuzzoha, pp. 147-160
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Text
Structural properties
of molecular beam epitaxy-grown Ni/Pt-superlattices
W. Staiger, A. Michel, V. Pierron-Bohnes, N. Hermann, M.C. Cadeville,
pp. 161-174
Full
Text
Epitaxial growth
of aluminum nitride layers on Si(111) at high temperature and
for different thicknesses
F. Malengreau, M. Vermeersch, S. Hagège, R. Sporken, M.D.
Lange, R. Caudano, pp. 175-188
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Text
Low temperature synthesis
of lead titanate by a hydrothermal method
J. Moon, T. Li, C.A. Randall, J.H. Adair, pp. 189-197
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Text
Sintering of the
ultrahigh pressure densified hydroxyapatite monolithic xerogels
J. Majling, P. Znáik, A. Palová, S. Svetík,
S. Kovalík, D.K. Agrawal, R. Roy, pp. 198-202
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Text
High temperature
strength of silicon nitride ceramics with ytterbium silicon oxynitride
T. Nishimura, M. Mitomo, H. Suematsu, pp. 203-209
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Text
Residual surface
stress by localized contact-creep
S. Widjaja, K. Jakus, R. Atri, J.E. Ritter, S. Bhattacharya, pp.
210-217
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Text
Excimer laser ablation
of aluminum nitride
J.K. Lumpp, S.D. Allen, pp. 218-225
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Text
Change of the weak
field properties of Pb(ZrTi)O3 piezoceramics with compressive
uniaxial stresses and its links to the effect of dopants on the
stability of the polarizations in the materials
Q.M. Zhang, J. Zhao, K. Uchino, J. Zheng, pp. 226-234
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Text
Computer simulations
of interactions between ultrafine alumina particles produced by
an arc discharge
M.H. Teng, L.D. Marks, D.L. Johnson, pp. 235-243
Full
Text
Balance of graphite
deposition and multi-shell carbon nanotube growth in the carbon
arc-discharge
P.M. Ajayan, Ph. Redlich, M. Rühle, pp. 244-252
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Text
The characterization
of strain, impurity content and crush strength of synthetic diamond
crystals
T.L. McCormick, W.E. Jackson, R.J. Nemanich, pp. 253-263
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Text
The structural characterization
of amorphous thin films and coatings in their as-deposited
state using x-rays at shallow angles of incidence
J.S. Rigden, R.J. Newport, G. Bushnell-Wye, pp. 264-276
Full
Text
Effect of oxygen
gas on polycarbonate surface in keV energy Ar+ ion irradiation
J-S. Cho, W-K. Choi, K.H. Yoon, H-J. Jung, S-K. Koh, pp. 277-282
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Text
COMMENTARIES AND REVIEWS
Laser-assisted
formation of metallic oxide microtubes
L. Nánai, T.F. George, pp. 283-284
Full
Text
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