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2004 FALL MEETING PROCEEDINGS
Symposium U
Stability of Thin Films and Nanostructures
Editors: R.P. Vinci, R. Schwaiger, A. Karim, V. Shenoy
MRS Proceedings Volume 854E
Electronic-Only Publication
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| Suggested format for citation of papers in this volume: |
| List all author names: Title of article, in Stability of Thin Films and Nanostructures, edited by R.P. Vinci, R. Schwaiger, A. Karim, and V. Shenoy (Mater. Res. Soc. Symp. Proc. 854E, Warrendale, PA , 2005), insert paper number. |
Pattern Formation on Silicon-on-Insulator U1.3/JJ1.3/KK1.3
Frank S. Flack, Bin Yang, Minghuang Huang, Matt Marcus, Jason Simmons, Olivia M. Castellini, Mark A. Eriksson, Feng Liu, and Max G. Lagally
Controlling (In,Ga)As Quantum Structures on High Index GaAs Surfaces U1.8/JJ1.8/KK1.8
Sh. Seydmohamadi, H. Wen, Zh.M. Wang, and G.J. Salamo
Spontaneous Formation of Ridges on Patterned Mesas and Their Role in the Evolution of Step Arrays U2.5/JJ2.5/KK2.5
Kee-Chul Chang and Jack M. Blakely
Stress Stability of Poly-SiGe and Various Oxide Films in Humid Environments U3.3
Carrie W. Low, Brian L. Bircumshaw, Tatiana Dorofeeva, Gelila Solomon, Tsu-Jae King, and Roger T. Howe
Electronic Excitations of Stable Fullerene-Like GaP Clusters U3.4
Giuliano Malloci, Giancarlo Cappellini, Giacomo Mulas, and Guido Satta
Simulation of the Organization of Heteroepitaxial Monolayer Islands Under Anisotropic Conditions U3.7
Gajendra Pandey and Robert V. Kukta
Nano-Scale Stress and Compositional Analysis of Epitaxial Si1-xGex / Si (100) Undulated Films U3.8
Chi-Chin Wu and Robert Hull
Kinetic Control of Dome Cluster Composition by Varying Ge Deposition Rate U4.4
E.P. McDaniel, Jeff Drucker, Qian Jiang, P.A. Crozier, and David J. Smith
Real-Time Coarsening Dynamics of Ge/Si(100) Nanostructures Using Elevated Temperature Scanning Tunneling Microscopy U4.6
Michael R. Mckay, Jeff Drucker, and John Shumway
Integration of Nanocrystal Quantum Dots With Crystalline Semiconductor Substrates: Structure, Stability, and Optical Response U4.7
Atul Konkar, Siyuan Lu, Anupam Madhukar, Steven. M. Hughes, and A. Paul Alivisatos
Energetics and Kinetics of Epitaxial Island Formation on Lattice Mismatched Patterned Substrates U4.11
Noah D. Machtay and Robert V. Kukta
Stability Study of Highly Dispersed Au Clusters Produced on Defected TiO2 (110); Evidence from SEM and Olefin TPD U5.2
Y. Yang and E. McFarland
Enhanced Solubility of Cu in Ag Nanoparticles Synthesized by Inert Gas Condensation U5.5
Abdullah Ceylan, C. Ni, and S. Ismat Shah
Stability and Structural Transition of Gold Nanowires Under Their Own Surface Stresses U5.7
Ken Gall, Michael Haftel, Jiankuai Diao, Martin L. Dunn, Noam Bernstein, and Michael J. Mehl
Morphological Changes While Growing Nickel Monosilicide Nanowires U5.10
Joondong Kim, Wayne A. Anderson, Elena A. Guliants, and Christopher E. Bunker
Thermal Stability of Nanostructured TiN-TiB2 Thin Films U6.2
Paul H. Mayrhofer and Christian Mitterer
Thermomechanical Behavior and Microstructural Evolution in Tantalum Thin Films U6.8
Robert Knepper, Katherine Jackson, Blake Stevens, and Shefford P. Baker
Molecular Dynamics Study of Grain Growth in Nanocrystalline Materials in the Presence of Dopants U6.10
Paul C. Millett, R. Panneer Selvam, and Ashok Saxena
Surface Instability of Microscale Multilayer Thin Film System U7.2
Yueguang Wei, Di Jiang, Ajing Cao, and Haifeng Zhao
Morphology and Microstructure Evolution of Multilayer Au/Cr/Si Thin Films Subject to Annealing U7.5
David Miller, Cari Herrmann, Hans Maier, Steve George, Conrad Stoldt, and Ken Gall
Thickness-Dependent Structural Relaxation of Plasma-Enhanced Chemical Vapor Deposited Silicon Oxide Films During Thermal Processing U8.1
Zhiqiang Cao and Xin Zhang
Trapping of Hydrogen in Carbon Nitride Films During or After High Temperature Heat Treatment U8.4
David C. Ingram, Asghar Kayani, William C. Lanter, and Charles A. DeJoseph
Stability of WC Nanoparticles for NOx Reduction U8.7
A.K. Rumaiz, S.I. Shah,, H.Y. Lin, I. Baldytchev, and J.G. Chen
Thin Films Stress Aging Study Using Micromachined Cantilevers U8.12
Christophe Malhaire, Alexandru Andrei, Sebastiano Brida, and Daniel Barbier
Atmospheric Stability of E-Beam Deposited Optical Thin Film Stacks U8.13
Ping Hou; Lianchao Sun, and Fei Luo
The Geometry of Amorphous Silicon Effect on Metal Induced Lateral Crystallization Rate U8.15
Y.-S. Kim, M.-S. Kim, and S.-K. Joo
Growth, Crystal Structure and Stability of Ag-Ni/Cu Films U8.17
I.K. Bdikin, G.K. Strukova, G.V. Strukov, V.V. Kedrov, D.V. Matveev, S.A. Zver'kov, and A.L. Kholkin
The Residual Stress Effect on Microstructure and Optical Property of ZnO Films Produced by RF Sputtering U8.18
Sang Ryu and Youngman Kim
Residual Stress and Microstructural Evolution in Thin Film Materials for a Micro Solid Oxide Fuel Cell (SOFC) U8.19
David Quinn, S. Mark Spearing, and Brian L. Wardle
Failure of Brittle Functional Layers in Flexible Electronic Devices U9.2
Judith de Goede, Piet Bouten, Léonard Médico, Yves Leterrier, Jan-Anders Månson, and Giovanni Nisato
Sub-Critical Telephone Cord Delamination Propagation and Adhesion Measurements U9.5
Alex A. Volinsky, Patrick Waters, James D. Kiely, and Earl C. Johns
Mode-I Fracture Toughness of Tetrahedral Amorphous Diamond-Like Carbon (ta-C) MEMS U9.7
K. Jonnalagadda, S.W. Cho, I. Chasiotis, T.A. Friedmann, and J.P. Sullivan
Influence of Macro- and Nanotopography, Thin Film Thermomechanical Behavior and Process Parameters on the Stability of Thermocompression Bonding U9.11
Konstantinos Stamoulis and S. Mark Spearing
Direct Measurements of Fracture Toughness and Crack Growth in Polysilicon MEMS U10.6
I. Chasiotis, S.W. Cho, and K. Jonnalagadda
Effective Modulus and Stress Relaxation of Freestanding Aluminum Microtensile Beams U10.10
P.A. El-Deiry, N. Barbosa III, W.L. Brown, R.P. Vinci
Stress Hysteresis and Thermal-Mechanical Behavior of PECVD Silicon Nitride and Ebeam Aluminum Films for Microbolometer Applications U10.11
Shusen Huang and Xin Zhang
Microstructure Evolution Across Interfaces of Heterogeneous Metal Systems Under Ultrasonic Impact U11.2
Youhong Li, Yinon Ashkenazy, and Robert S. Averback
Confinement Effects in Nanoscale Anodic Alumina Structures on Silicon U11.5
Patrick J. Griffin, Robert W. Carpick, and Donald S. Stone
Suppression of Dewetting in Pulsed Laser Melting of Thin Metallic Films on SiO2 U11.6
J. Eric Kline and John P. Leonard
Temperature Dependence of Stress Distribution in Depth for Cu Thin Films U11.11
Tokuji Himuro and Shinji Takayama
In Situ TEM Studies of Nanoscale Cu Interconnects Under Thermal Stress U11.13
Jin Ho An and P.J. Ferreira
The Effects of Nanoscopic Fillers on the Viscoelastic Response of Polymers U11.16
Jean Harry Xavier, J. Sokolov, and M.H. Rafailovich
Structural Evolution and Alignment of Cylinder-Forming PS-b-PEP Thin Films in Confinement Studied by Time-Lapse Atomic Force Microscopy U11.17
Qin Zheng, Dong-Chan Lee, Luping Yu, and S. J. Sibener
Self-Assembled Patterns in a Polymer Thin Film U12.4
David Salac and Wei Lu
Stretchability of Complex Patterns of Thin Metal Conductors on Elastomeric Skin U12.10
Stéphanie P. Lacour and Sigurd Wagner
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