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2004 FALL MEETING PROCEEDINGS
Symposium O
Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Editors: S.V. Kalinin, B. Goldberg, L.M. Eng, B.D. Huey
MRS Proceedings Volume 838E
Electronic-Only Publication
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| Suggested format for citation of papers in this volume: |
| List all author names: Title of article, in Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials, edited by S.V. Kalinin, B. Goldberg, L.M. Eng, and .D. Huey (Mater. Res. Soc. Symp. Proc. 838E, Warrendale, PA , 2005), insert paper number. |
Linear Measurements of Nanomechanical Phenomena Using Small-Amplitude AFM O1.8
Peter M. Hoffmann, Shivprasad Patil, George Matei, Atay Tanulku, Ralph Grimble, Özgur Özer, Steve Jeffery, Ahmet Oral, and John Pethica
Atomically Resolved Imaging of Epitaxial CaF2 on Si(111) Using Noncontact Atomic Force Microscope O1.9
Yoshihide Seino, Masayuki Abe, and Seizo Morita
Quantitative and Nanoscale Surface Potential Tracking of Ionic and Organic Adsorbates at sub-Monolayer Coverage O1.10
L.M. Eng, Ch. Loppacher, and U. Zerweck
Near-Field Scanning Optical Microscopy of Phase Separation Effects in Dilute Nitride Alloys O3.1
Alexander Mintairov, Thomas Kosel, Kai Sun, Victor Ustinov, and James Merz
Apertureless Head: A Multipurpose Tool Really Combining Atomic Force Microscopy With Powerful Means for Optical Investigations O4.3
Vasily V. Gavrilyuk, Serguey A. Saunin, Vladimir V. Zhizhimontov, and Victor V. Baukov
A Scanning Tunneling Microscopy Study: Si/SiO2 Interface Roughness Induced by Chemical Etching O4.9
Jixin Yu, Lequn Liu, and Joseph W. Lyding
Direct Observation of Polar Nanostructures in PLZT Ceramics for Electrooptic Applications O4.16
V.V. Shvartsman, A. Orlova, D. Kiselev, A. Sternberg, and A.L. Kholkin
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Optical Near-Field Enhancement Around Lithographic Metallic Nanostructures Using an Azodye Polymer: Direct Observation and Realization of Sub-Wavelength Complex Structures O5.2
Christophe Hubert, Anna Rumyantseva, Gilles Lérondel, Johan Grand, Sergeï Kostcheev, Laurent Billot, Alexandre Vial, Renaud Bachelot, and Pascal Royer, Gilbert Chang, Stephen K. Gray, Gary P. Wiederrecht, and George C. Schatz |
Radiation Induced Subsurface Charging in the Buried Oxide Layer in SIMOX O6.2
M.A. Stevens-Kalceff and S. Mickle
Absolute Measurement of Three-Dimensional Polarization Direction Using Scanning Nonlinear Dielectric Microscopy O7.3
Yasuo Cho, Tomoyuki Sugihara, and Hiroyuki Odagawa
Local Electromechanical Properties of Ferroelectric Materials for Piezoelectric Applications O7.6
A.L. Kholkin, I.K. Bdikin, V.V. Shvartsman, A. Orlova, D. Kiselev, A.A. Bogomolov, and S.-H. Kim
Nanoscale Elastic-Property Mapping With Contact-Resonance-Frequency AFM O8.2
D.C. Hurley, A.B. Kos, and P. Rice
Semiconductor Dopant Profile and Dielectric Characterization With Scanning Capacitance Microscopy O9.1
J.J. Kopanski
Scanning Conductance Microscopy and High Frequency Scanning Gate Microscopy of Carbon Nanotubes and Polyethylene Based Nanofibers O9.8
Cristian Staii, Rui Shao, Nicholas J. Pinto, Dawn A. Bonnell, and Alan T. Johnson Jr.
STM Image Simulation: Effect of the Number of Tunneling States and the Isosurface Value O10.1
Juan Radilla, Marcelo Galván, Yolanda Trinidad-Reyes, and Nikola Batina
Atomically Resolved STM Images of CVD Grown Carbon Nanotubes O10.2
Daniel (Ching-Shih) Chiang, Philip Zifeng Lei, Lifeng Dong, and Jun Jiao
Electrical AFM Measurements for Evaluation of Nitride Erosion in Shallow Trench Isolation Chemical Mechanical Planarization O10.5
Yordan Stefanov, Tino Ruland, and Udo Schwalke
Electrical Characterization Using Scanning Capacitance Microscopy of the Local Electronics Properties of Ge Semiconductor Nanostructures O10.12
G. Brémond, J.J. Marchand, A. Descamps, P. Budau, F. Bassani,A. Ronda, I. Berbezier, T. Stoïca, and L. Vescan
Mapping of Local Electronic Properties in Nanostructured CMR Thin Films by Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP) O10.13
Sohini Kar, Barnali Ghosh, L.K. Brar, M.A. Paranjape, and A.K. Raychaudhuri
Force-Strain Curves of Microcapsules With Atomic Force Microscopy O10.14
Eli Lansey and Fredy R. Zypman
Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments O10.16
Malgorzata Kopycinska-Müller, Roy H. Geiss, Paul Rice, and Donna C. Hurley
Frequency Response of Microcantilevers in Viscous Fluids O10.17
A.M. Schilowitz, D.G. Yablon, and F. Zypman
In Situ Monitoring of Dispersion Film Formation Using Tapping-Mode Atomic Force Microscopy O10.19
Jing Li, Wenbin Liang, and Steve Chum
Ballistic Electron Emission Luminescence of InAs Quantum Dots Embedded in a GaAs/AlxGa1-xAs Heterostructure O11.2
Wei Yi, Ian Appelbaum, Kasey J. Russell, Venkatesh Narayanamurti, Micah P. Hanson, and Arthur C. Gossard
Improve the Accuracy of Scanning Kelvin Probe Microscopy by Eliminating the Cantilever Effect O11.7
Zhitao Yang and Michael G. Spencer
A Near-Field Microwave Probe for Quantitative Characterization of Dielectric Thin Films O11.10
Vladimir V. Talanov, Robert L. Moreland, André Scherz, Bin Ming, and Andrew R. Schwartz
Theory of Scanning Probe Microscopy of Carbon Nanostructures O12.1
Vincent Meunier, Sergei Kalinin, and Philippe Lambin
Development of an Ultra-High Vacuum Scanning Nonlinear Dielectric Microscope and Near Atomic-Scale Observation of Ferroelectric Material Surfaces O14.1
Hiroyuki Odagawa and Yasuo Cho
Raman and Rayleigh Smart Imaging of Nanophases and Nanosized Materials: Alternatives Techniques to SEM, TEM and AFM? O14.2
Philippe Colomban and Mickaël Havel
High-Resolution Photochemical Reaction Using Triplet-Sensitizer Probes O14.6
Hideki Miki, Akira Otomo, and Shinro Mashiko
TEM Investigation of Nucleation and Initial Growth of ZnSe Nanowires O14.11
Y. Cai, S.K. Chan, I.K. Sou, Y.F. Chan, D.S. Su, and N. Wang
Scanning Probe Recognition Microscopy Investigation of the Elastic Properties of Tissue Scaffolding O15.2
Q. Chen, Y. Fan, V.M. Ayres, L. Udpa, M.S. Schindler, and A.F. Rice
Electronic Properties of Modified Surfaces Using Contact and Non-Contact Scanning Probe Microscopy Techniques and SECM O15.3
Aaron K Neufeld, Anthony O'Mullane, and Alan M Bond
Effects of Surface Functionality and Humidity on the Adhesion Force And Chemical Contrast Measured With AFM O15.5
Tinh Nguyen, Xiaohong Gu, Lijiang Chen, Duangrut Julthongpiput, Michael Fasolka, Kimberly Briggman, Jeeseong Hwang, and Jon Martin
The µ-TA (Scanning Thermal Microscopy)-A Tool for Quantitative Surface Analysis and Surface Treatment O15.7
Hartmut Fischer
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