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Bias-Voltage Dependence in Atomic-Scale Spin Polarized Scanning Tunneling Microscopy of Mn3N2 (010) GG1.2
Arthur R. Smith, Rong Yang, and Haiqiang Yang
Imaging, Manipulating, and Analyzing With Nanometer Precision: Application of the Nanoworkbench GG3.3
Olivier Guise, Joachim Ahner, Jeremy Levy, John T. Yates Jr.
Quantifying Field-Induced Contrast Effects in Photoelectron Emission Microscopy GG3.9
K. Siegrist, V.W. Ballarotto, and E.D. Williams
Visualization of Electrons and Holes Localized in the Gate Thin Film of Metal-Oxide Nitride-Oxide Semiconductor Type Flash Memory by Using Scanning Nonlinear Dielectric Microscopy GG4.2
Koichiro Honda and Yasuo Cho
Temperature Controlled Scanning Nonlinear Dielectric Microscopy GG4.3
K. Ohara and Y. Cho
Neutron Studies of Magnetic Recording Media GG4.4
S.L. Lee, T. Thomson, F.Y. Ogrin, C. Oates, M. Wismayer, C. Dewhurst, R. Cubitt , S. Harkness
Heteroepitaxy of InSe/GaSe on Si(111) Substrates GG4.5
J. Jasinski, Z. Liliental-Weber, A. Chaiken, G.A. Gibson, K. Nauka, C.C. Yang, and R. Bicknell
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