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SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE

Scanning Probe Microscopy in Materials Science, 443
E. Meyer, S.P. Jarvis, and N.D. Spencer, Guest Editors
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Atomic Force Microscopy of Biological Samples, 449
P.L.T.M. Frederix, B.W. Hoogenboom, D. Fotiadis, D.J. Müller, and A. Engel
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Imaging, Manipulation, and Spectroscopic Measurements of Nanomagnets by Magnetic Force Microscopy, 457
X. Zhu and P. Grütter
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The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials, 464
G.K. Bar and G.F. Meyers
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Measurements of In-Plane Material Properties with Scanning Probe Microscopy, 472
R.W. Carpick and M.A. Eriksson
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Scanning Probe Microscopy Measurements of Friction, 478
S.S. Perry
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Germanium Nanostructures on Silicon Observed by Scanning Probe Microscopy, 484
M. Tomitori and T. Arai
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Abstracts for August 2004 Journal of Materials Research, 508

Materials for Light and Smart Structures and for Rural Technology Addressed at MRS-I Conference, 488

2004 MRS Spring Meeting/IUMRS-ICEM 2004 Brings Together Emerging and Established Fields in Materials Research, 489

Letter from the President, 429
Interdependence Days
H.E. Katz

Research/Researchers, 431

Science Policy, 440
Industry, Academic Leaders Advocate Basic Research in Physical Sciences, J. Ouellette; U.K. Promotes International Collaboration in 10-Year Strategic Plan for Science, J. Ouellette

Advertisers in This Issue, 462

Upcoming Conferences, 506
Microwave and rf Applications

Library, 512
Encyclopedia of Materials: Science and Technology, K.H.J. Buschow, R.W. Cahn, M.C. Flemings, B. Ilschner, E.J. Kramer, and S. Mahajan, Editors, reviewed by J.H. Westbrook with assistance from R.C. DeVries, R.L. Fleischer, W.B. Hillig, R.P. Kambour, P.R.L. Malenfant, and J.C. Zhao

Calendar, 513

Classified, 516

Posterminaries, 520

Volume 29, No. 7
July 2004
Masthead

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ON THE COVER: Scanning Probe Microscopy in Materials Science. Scanning probe microscopy (SPM) encompasses a family of techniques that have become useful tools for characterizing the topography of material surfaces down to the nanometer scale. Shown on the cover is a schematic illustration of an SPM tip, superimposed on a sampling of images obtained by various SPM techniques. See the technical theme that begins on p. 443.