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Volume 27, No. 1 |
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A Publication of the Materials Research Society
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MECHANICAL PROPERTIES IN SMALL DIMENSIONS
Introduction: Mechanical Properties in Small
Dimensions, 12
R.P. Vinci and S.P. Baker, Guest Editors
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Physical Origins of Intrinsic Stresses in
Volmer-Weber Thin Films, 19
J.A. Floro, E. Chason, R.C. Cammarata, and D.J. Srolovitz
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Elastic and Anelastic Behavior of Materials
in Small Dimensions, 26
S.P. Baker, R.P. Vinci, and T. Arias
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Dislocation Plasticity in Thin Metal Films,
30
O. Kraft, L.B. Freund, R. Phillips, and E. Arzt
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Creep: Stresses and Strain Rates in Thin Films
and Multilayers, 39
D. Josell, T.P. Weihs, and H. Gao
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Article (PDF)
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Mechanisms Active during Fracture under Constraint, 45
R.F. Cook and Z. Suo
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Mechanical Properties in Small Dimensions: Comments from Industry,
52
With contributions from J.M.E. Harper, Q. Ma, T.M. Shaw, and
T.Y. Tsui
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Organic Materials Science, 56
2000 MRS Fall Meeting Von Hippel Award Presentation
G.M. Whitesides
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IUMRS Seeks Nominations for 2002 Somiya Award
on International Collaboration, 55
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King Leads MRS Executive Committee in 2002,
66
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Werwa Accepts MRS/OSA Congressional Fellowship
Position with Rep. Honda, 68
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JMR Launches Manuscript Central, 68
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Abstracts for February 2002 Journal of Materials Research, 69
Letter from the President -- Keeping an
Eye on MRS's Long-Range Goals, Alex King, 3
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Research/Researchers, 4
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Advertisers in this Issue, 8
Washington News, 9
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Public Affairs Forum -- Training U.S. Workers
for the Next Generation of Technology, Joseph I. Lieberman,
10
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Resources, 11
Calendar, 72
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Classified, 76
Posterminaries, Belated Rejuvenation,
C. Draper, 80
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ON THE COVER: Mechanical Properties
in Small Dimensions. A colorized cross section of a Ag/Ni multilayer
on a thin sapphire substrate after 24 h of biaxial zero-creep
testing at 500°C. The image was obtained using secondary
electron imaging after focused-ion-beam milling. Note the significant
grooving into the Ni layers where the Ni grain boundaries meet
the Ag/Ni interfaces. Imaging and milling courtesy of A. Wilson
and G. Spanos, Naval Research Laboratory, who gratefully acknowledge
support from the Office of Naval Research. See the technical
theme that begins on p. 12.

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