Volume 25, No. 2 February 2000
A Publication of the Materials Research
Society
FOCUSED MEV ION BEAMS FOR MATERIALS
ANALYSIS AND MICROFABRICATION
• Focused MeV Ion Beams for
Materials Analysis and Microfabrication, p. 11
• M.B.H. Breese, Guest Editor
• Analysis of Integrated Circuits
and Semiconductor Materials
• Using IBIC Microscopy, p.
14
• H. Schöne and D.N. Jamieson
• Imaging and Analysis of Crystal
Defects Using Transmission
• Channeling, p. 21
• P. King
• Ion-Beam Rocking Measurements
of Small Lattice Strains, p. 28
• D.G. de Kerckhove
• Three-Dimensional Microfabrication
Using Maskless
• Irradiation with MeV Ion Beams:
Proton-Beam Micromachining, p. 33
• F. Watt, J.A. van Kan, and
T. Osipowicz
• Single-Ion Micromechanics,
p. 39
• B.E. Fischer and S. Metzger
MATERIALS CHALLENGES FOR THE NEXT CENTURY
• A Centennial Report p. 43
• A. Cottrell
MRS NEWS
• MRS Featured Volunteer, p. 47
ABSTRACTS
• Abstracts for March 2000 Journal of Materials Research p. 52
DEPARTMENTS
• Research/Researchers,
p. 4
• Washington
News, p. 8
• Resources,
p. 10
• Advertisers in This Issue p. 47
• Career
Clips, p. 50
• Library,
p. 51
• Impurities in Engineering
Materials: Impact, Reliability and
• Control, C.L. Briant, ed.,
reviewed by R.W. Cahn
• Electronic Genie: The Tangled
History of Silicon,
• F. Seitz and N.G. Einspruch,
reviewed by R.W. Cahn
• Classified p. 55
[Information from the Table of Contents may be reproduced]
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