August 1997
A Publication of the Materials Research Society
NANOSCALE CHARACTERIZATION OF MATERIALS
-
Nanoscale Characterization of Materials
E.T. Yu and S.J. Pennycook, Guest Editors
Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures
E.T. Yu
Near-Field Scanning Optical Microscopy Studies of Materials and Devices
J.W.P. Hsu
Correlation Between Nanoscale Structural, Electronic, and Magnetic Properties of Thin Films by Scanning-Probe Microscopy and Spectroscopy
R. Wiesendanger
High-Resolution Imaging of Liquid Structures: Wetting and Capillary Phenomena at the Nanometer Scale
M. Salmeron, L. Xu, J. Hu, and Q. Dai
Model Systems for Metal-Cramic Interface Studies
M. Wagner, T. Wagner, D.L. Carroll, J. Marien, D.A. Bonnell, and M.Rühle
High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
U. Dahmen, E. Johnson, S.Q. Xiao, and A. Johansen
Z-Contrast Imaging of Grain-Boundary Core Structures in Semiconductors M.F. Chisholm and S.J. Pennycook
Time-Resolved High-Resolution Electron Microscopy of Clusters, Surfaces, and Interfaces
N. Tanaka and T. Kizuka
-
MRS Seeks Nominees for Outstanding Young Investigator Award, 1998
-
Abstracts for October 1997 Journal of Materials Research
-
Letters to the Editor
Research/Researchers
Washington News
Resources
Editor's Choice
Advertisers in This Issue
Historical Note
Library
- Solid State Physics: Advances in Research and Applications, vol.50, H.
Ehrenreich and F. Spaepen, eds., reviewed by R. Cahn; Semiconducting
Transparent Thin Films, H.L. Hartnagel, A.L. Dawar, A.K. Jain, and C.
Jagadish, reviewed by S.J. Pearton; Encyclopedia of Applied Physics, Vols.
1-19, G.L. Trigg, ed., reviewed by J.H. Westbrook.