Volume 17, No. 7 July 1992
A Publication of the Materials Research Society
MECHANICAL BEHAVIOR OF THIN FILMS
- Mechanical Behavior of Thin Films, p. 25
J.C. Bravman and W.D. nix, Guest Editors - Measurement of Thin Film Mechanical Properties Using Nanoindentation,
p. 28
G.M. Pharr and W.C. Oliver - Mechanical Characterization of Thin Films by Micromechanical
Techniques, p. 34
J-A. Schweitz - Stress Determination in Textured Thin Films Using X-Ray Diffraction,
p. 46
B.M. Clemens and J.A. Bain - Dislocation Mechanisms of Relaxation in Strained Epitaxial
Films, p. 52
L.B. Freund - Mechanisms of Stress-Induced and Electromigration-Induced
Damage in Passivated Narrow Metallizations on Rigid Substrates,
p. 61
M.A. Korhonen, P. Borgesen, and C-Y. Li
SPECIAL FEATURE
- Why We Don't Have a Room-Temperature Superconductor-Yet,
p. 70
1991 MRS Fall Meeting Von Hipple Address
T.H. Geballe
DEPARTMENTS
- Material Matters, p. 7
- Research/Researchers, p. 14
- Resources, p. 21
- From Washington, p. 22
- Education Exchange, p. 78
- Historical Note, p. 80
- Advertisers in this Issue, p. 81
- Calendar, p. 82
- Classified, p. 87
- Posterminaries, p. 88
[Information from the Table of Contents may be reproduced]
