Volume 17, No. 12 December 1992
A Publication of the Materials Research Society
QUANTITATIVE ANALYSIS OF THIN FILMS
- Quantitative Analysis of Thin Films Part I, p. 20
Y. Bruynseraede and I.K. Schuller, Guest Editors - Microscopic Properties of Thin Films: Learning About Point
Defects, p. 24
A. Ourmazd, M. Scheffler, M. Heinemann, and J-L. Rouviere - Quantitative X-Ray Diffraction from Superlattices, p. 33
E.E. Fullerton, I.K. Schuller, and Y. Bruynseraede - Quantitative Auger and XPS Analysis of Thin Films, p. 39
J.M. Slaughter, W. Weber, G. Guntherodt, and C.M. Falco
MRS NEWS
- Nominations Due for 1993 MRS Spring Meeting Graduate Students
Awards, p. 46
DEPARTMENTS
- Letter from the President, p. 5
- Letters to the Editor, p. 7
- Resources, p. 8
- Research/Researchers, p. 9
- From Washington, p. 15
- Editor's Choice, p. 18
- Section News, p. 46
- Advertisers in this Issue, p. 46
- Education Exchange, p. 47
- Historical Note, p. 49
- Book Reviews, p. 51
- Classified, p. 53
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