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Materials Characterization
One of Four Mailing List Categories Available
The categories in this section relate to the techniques by which materials are characterized. Individuals included in these categories have a special interest in the characterization methods and related instrumentation.
| U.S. | Non-U.S. | Total | ||
|---|---|---|---|---|
| C2.22 | Microstructure | 3,303 |
4,073 |
7,376 |
a. Electron microscopy |
1,467 |
2,039 |
3,506 |
|
b. Diffraction & scattering |
1,470 |
1,934 |
3,404 |
|
c. SPM |
2,566 |
2,851 |
5,417 |
|
| C3.22 | Chemical Composition | 1,419 |
2,032 |
3,451 |
| a. Surface analysis | 1,240 |
1,727 |
2,967 |
|
| b. Near-surface analysis | 201 |
302 |
503 |
|
| c. Bulk analysis | 323 |
545 |
868 |
|
| d. Gas phase | 90 |
144 |
234 |
|
| C4.22 | Electrical Properties | 2,815 |
3,555 |
6,370 |
| a. Semiconductor defects | 1,663 |
2,068 |
3,731 |
|
| b. Devices | 2,204 |
2,395 |
4,599 |
|
| C5.22 | Mechanical Properties | 1,942 |
1,888 |
3,830 |
| C6.22 | Modeling | 4,463 |
3,954 |
8,417 |
| a. Atomic scale | 3,107 |
3,212 |
6,319 |
|
| b. Plasmas | 280 |
212 |
492 |
|
| c. Phase transformations | 404 |
301 |
705 |
|
| d. Fractals | 3 |
1 |
4 |
|
| e. Nucleation & growth | 1,129 |
823 |
1,952 |
|
| f. Materials processing | 2,201 |
1,365 |
3,566 |
|
| C7.22 | Aging & Degradation | 4,730 |
6,866 |
11,596 |
| C8.22 | Optical Properties | 3,223 |
4,434 |
7,657 |
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©1995-2005
Materials Research Society
506 Keystone Drive
Warrendale PA 15086-7573 USA
Phone: 724.779.3003, Fax: 724.779.8313
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