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Symposium A: Amorphous Silicon Technology - 1996 The Amorphous Silicon Technology Symposium brings together scientists working on amorphous silicon based device technologies and on fundamental materials issues. We call for original papers reporting on progress in deposition technologies and processes, materials characterization, device design and manufacturing issues, as well as novel applications. Recent symposia in this series have highlighted work on: * Deposition - remote and direct plasma deposition, chemical vapor and hot-wire deposition, sputtering, and chemical annealing * Characterization - structure, hydrogen's role, origins of stability, defect density-of-states and relaxation, and electrical transport * Devices - thin-film transistors, solar cells, detectors, sensors, emitters, and memories * Applications - active-matrix liquid crystal displays and two-dimensional imaging The symposium is planned for seven half-day sessions of oral presentations and two evening poster sessions; the number of posters will be limited to ensure a good opportunity for discussion. Note that this MRS Meeting will also be the venue for a symposium on Flat Panel Display Materials (Symposium H) and another on Thin Films for Photovoltaic and Related Device Applications (Symposium J); joint sessions of the three symposia are planned. In addition to the formal abstract, authors are encouraged to submit an additional page of supporting text/figures. A tutorial complementing this symposium is tentatively planned to precede the symposium. Further information will be included in the program book scheduled for mailing February 1996. Symposium Program Committee: Ruud Schropp (Utrecht University, The Netherlands), Michael Hack (Xerox PARC); Eric Schiff (Syracuse University); Hiroaki Okamoto (Osaka University); Robert Collins (Pennsylvania State University); Yue Kuo (IBM); Isamu Shimizu (Tokyo Institute of Technology); Jerome Perrini (Ecole Polytechnique); and Martin Stutzmann (Technical University of Munich) Yes, Tell Me How To Submit an Abstract Symposium Organizers Michael Hack Xerox Palo Alto Research Center 3333 Coyote Hill Road Palo Alto, CA 94304 Phone (415) 812-4535 Fax (415) 493-6349 hack@parc.xerox.com Eric A. Schiff Department of Physics Syracuse University Syracuse, NY 13244-1130 Phone (315) 443-3908 Fax (315) 443-9103 schiff@suhep.phy.syr.edu Sigurd Wagner B422 Engineering Quad Department of Electrical Engineering Princeton University Princeton, NJ 08544 Phone (609) 258-4631 Fax (609) 258-4631 wagner@princeton.edu Ruud Schropp Atomic and Interface Physics Debye Institute University of Utrecht P.O. Box 80,000 3508 TA Utrecht The Netherlands Phone (31) 30-533170 Fax (31) 30-543165 r.e.i.schropp@fys.ruu.nl Akihisa Matsuda Electrotechnical Laboratory 1-1-4 Umezono Tsukuba-shi, Ibaraki 305 Japan Phone (81) 298-54-5252 Fax (81) 298-58-5425 amatsuda@qm.etl.go.jp Administrative Contact: Mary Ann Woolf Department of Physics/201 JFB University of Utah Salt Lake City, UT 84112 Phone (801) 581-4246/4801 Fax (801) 581-4246 woolf@pclab.physics.utah.edu
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