As
a complement to the 2005 MRS Spring Meeting, the Materials
Research Society continued Research Tools Seminars, an
exciting educational program that focused on the scientific
basis and practical application of commercially-available,
state-of-the-art tools for materials research. Held in
the Exhibit Hall and free-of-charge to meeting attendees,
these one-hour seminars described a technical approach
to meet a particular challenge, as embodied in commercially-available
products or tools.
| Wednesday, March 30 |
| Time/Presenter |
Topic |
2:00 - 3:00 pm
FEI Company
Booth 418
|
3-Dimensional Imaging Using DualBeam™ SEM/FIB and TEM Tomography
Study the 3D structure of materials using the DualBeam™ SEM/FIB Slice & View technique. The FIB acts as a “nano-scalpel” enabling precision cutting and slicing of samples to reveal their internal structure. The SEM provides high resolution imaging of the freshly cut surfaces. Automated sequential milling and imaging (Slice & View) yields a data set that can be rendered into a 3D tomogram. Examples of the benefits of using DualBeam for materials research will be presented. |
3:30 - 4:30 pm
Kinetic Technologies Ltd.
Booth 429 |
Multiscale Approach for Kinetic Modeling of Thin Film Growth
A detailed kinetic mechanism of ALD processes is developed based on the results of first-principles calculations using a multilevel software tool, Khimera, which bridges the gap between quantum chemistry and chemical kinetics and thermodynamics.
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