This symposium has a long tradition of representing current topics in thin-film properties and how they are related to the performance and reliability of thin-film structures. Several emerging and well-developed technologies rely on understanding the behavior of these structures, including: information storage technology, high-performance coatings, micro- and nanoelectromechanical systems, and biomedical devices. This 11th symposium in the continuing series aims to provide a forum for stress-related phenomena in thin films for a wide range of materials, specifically including polymeric and biological materials. Of particular interest are studies that explore the frontiers of thin-film materials science with regard to materials selection and size scale. A fundamental goal of this symposium is to establish an atmosphere promoting an exchange of ideas between researchers who are interested in the mechanical behavior of thin films, broadly applied to their materials choice or methodology.
Session Topics
Papers that discuss experimental work, as well as theory, modeling and simulation on stresses and mechanical behavior of materials subjected to the thin-film constraint, are solicited in, but not limited to, the following areas:
- Plasticity in thin metallic films and multilayers: geometry effects, grain-size effects, alloying, and interfaces
- Elasticity in thin films and multilayers, especially with regard to interpreting the role of geometry and grain size
- Fracture in thin film as it is related to size effects, multilayers, and microsystems
- Novel mechanical test methods such as those which cut across length scales measuring force, temperature, strain, etc.
- In-situ testing methods (electron microscopy, x-ray diffraction, etc.)
- Stability of interfaces in multilayer films
- Creep and viscoelasticity and other time-dependent phenomena
- Polymer thin films and their mechanical properties
- Biological thin films and their mechanical properties
- Smart-material thin films (SMA's, etc.) and their mechanical properties
- Fatigue (size effects, frequency effects, etc.)
- Influence of stress on optical, electrical, and magnetic properties
- Nanoscale features and geometries
- Tribological aspects of thin films: adhesion, friction, and wear
- Growth stresses in thin films due to chemical effects, ion bombardment, etc.
|
Invited Speakers
Invited speakers include: Greg Carmen (Univ. of California-Los Angeles), Yury Gogosti (Drexel Univ.), Young-Chang Joo (Seoul National Univ., Korea), Junichi Koike (Tohoku Univ., Japan), Marc Legros (CNRS, France), Hirotsugu Ogi (Osaka Univ., Japan), Eric Stach (Lawrence Berkeley National Lab), Carl Thompson (Massachusetts Inst. of Technology), and Cynthia Volkert (FZ Karlsruhe, Germany) |
Joint Sessions
Joint sessions are anticipated with Symposia B: Materials, Technology, and Reliability of Advanced Interconnects ; Symposia J: Micro- and Nanosystems—Materials and Devices; and Symposia BB: Mechanical Properties of Nanostructured Materials—Experiments and Modeling. |
Tutorial Session
| A tutorial complementing this symposium is tentatively planned. Further information will be included in the program that will be available in January. (Find out more about the 2005 MRS Spring Meeting Tutorial Program.) |
Symposium Organizers
Thomas Buchheit
Microsystems Materials
MS 0889
Dept. 1851
Sandia National Laboratories
Albuquerque, NM 87185
Tel: 505-845-0298
Fax: 505-844-4816
tebuchh@sandia.gov |
Ralph Spolenak
ETH-Hönggerberg, Laboratory for Nanometallurgy
Dept. of Materials
HCI F 529
Wolfgang-Pauli-Str. 10,
CH-8093
Zürich, Switzerland
Tel: 41-1-632-2590
Fax: 41-1-632-1101
ralph.spolenak@mat.ethz.ch |
Kazuki Takashima
Kumamoto University
Dept. Materials Science & Mechanical Engineering
2-39-1 Kurokami
Kumamoto 860-8555, Japan
Tel/Fax: 81-96-342-3716
takashik@gpo.kumamoto-u.ac.jp |
Andrew Minor
Lawrence Berkeley National Laboratory
National Center for Electron Microscopy
MS 7
One Cyclotron Rd.
Berkeley, CA 94720
Tel: 510-495-2749
Fax: 510-486-5888
aminor@lbl.gov |
|
