April 15-18
San Francisco, California
Meeting Chairs:
A. Wayne Johnson, Susan K. Kelso,
K. S. SreeHarsha
Technical Symposia
| A | Ion Beam Processes in Advanced Electronic Materials and Device Technology |
| B | Microscopic Indentification of Electronic Defects in Semiconductors |
| C | Thin Films: The Relationship of Structure to Properties |
| D | Mass Memory Technologies |
| E | Applied Materials Characterization |
| F | Materials Issues in Applications of Amorphous Silicon Technology |
| G | XUV and X-ray Optics for Synchrotron Radiation |
| H | High-Power Dielectric Optical Mirros |
| X | Frontier of Materials Research |
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