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As a complement to
the 2003 MRS Fall Meeting, the Materials Research Society presented Research Tools Seminars, an exciting educational program that
focuses on the scientific basis and practical application of commercially-available,
state-of-the-art tools for materials research. Held in the Exhibit Hall
and free-of-charge to meeting attendees, these one-hour seminars described a technical approach to meet a particular challenge, as embodied
in commerically-available products or tools.
Tuesday, December 2
| 2:30
- 3:30 pm |
Atomic
Force Acoustical Microscopy (AFAM) and High
Throughput Combinatorial Microscopy: Two New Approaches for Analyzing
Advanced Materials
Nanotech-America • Springfield, MA
Scanning Probe Microscopy (SPM) is the fastest growing analytical technique in the materials market. No longer the tool just for elite physicists, SPMs are now key for R&D, QA/QC and failure analysis.
This seminar presented two new methods for polymer analysis: Atomic Force Acoustic Microscopy (AFAM), a new method for imaging differences in density within polymers and other advanced materials, and High Throughput Combinatorial Imaging, a cross-over technique from the biotech world which enables polymer labs to conduct dozens of tests simultaneously, significantly reducing time to market and research and development costs. |
| 3:30
- 4:30 pm |
Automated
Standard Porosimeter
Porotech Ltd. • Ontario, Canada
Understanding the pore structure of materials is crucial. Current
technologies are lagging in their capabilities. This seminar provided
a new look at porous materials with accuracy and information previously
unattainable. |
Wednesday,
December 3
| 10:30
- 11:30 am |
Advanced
Methods for Characterization of Magnetic
Materials
Quantum Design, Inc. • San Diego, CA
Principles and techniques for measurement of small samples using
variable temperature and magnetic field instruments. Applications
include SQUID-based magnetometry, vibrating sample magnetometers and
AC susceptibility. |
| 2:30
- 3:30 pm |
New
Tools for Nanotechnology Research
Veeco Instruments Inc. • Woodbury, NY
Cantilever-based research station for sensor development; a new
primary mode for atomic force microscopy; and a tool for AFM scanning
in vacuum, liquid, and ambient environments, with temperature control. |
| 3:30
- 4:30 pm |
Epitaxial
Deposition of Thin Film Layers Using
Cutting-Edge MOCVD Technology
EMCORE Corporation • Somerset, NJ
This seminar detailed the latest generation of research level
MOCVD reactors, which achieve uniform deposition of thin films through
precise control of source materials and an emphasis on interface switching
and boundary layer optimization. Innovative in situ characterization
techniques was alsodiscussed, with a focus on the progress being
made by researchers in the monitoring and fine tuning of such critical
process elements as wafer temperature, growth rate, and surface morphology.
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