* Invited paper
Also in conjunction with
Symposium NN
SESSION G1: ATOMIC SCALE CHARACTERIZATION WITH ELECTRON OPTICS
Chair: Xiaoqing Q. Pan
Monday Morning, December 2, 2002
Room 200 (Hynes)
8:30 AM *G1.1
NANOSCALE STRUCTURE/PROPERTY CORRELATION THROUGH ABERRATION-CORRECTED
STEM AND THEORY. S.J. Pennycook, A.R. Lupini, Solid State
Division, Oak Ridge National Laboratory, Oak Ridge, TN; P.D. Nellist,
O.L. Krivanek, N. Dellby, Nion Co., Kirkland, WA; J.R. McBride,
S.J. Rosenthal, Department of Chemistry, Vanderbilt University,
Nashville, TN; G. Duscher, Department of Materials Science and
Engineering, North Carolina State University, Raleigh, NC; M.
Glasov, Alcoa Technical Center, Pittsburgh, PA; K. Sohlberg, Department
of Chemistry, Drexel University, Philadelphia, PA; S. Rashkeev,
and S.T. Pantelides, Department of Physics and Astronomy, Vanderbilt
University, Nashville, TN.
9:00 AM G1.2
NANOSCALE 3D CHEMICAL MAPPING BY SPECTROSCOPIC ELECTRON TOMOGRAPHY.
Günter Möbus, Ron Doole, Beverley Inkson, Dept
of Materials, Oxford University, UNITED KINGDOM.
9:15 AM G1.3
ATOMIC RESOLUTION OF LITHIUM IONS IN LiCoO
. Y. Shao-Horn, Institut de Chimie
de la Matiere Condensee de Bordeaux-CNRS and Ecole Nationale Superieure
de Chimie et Physique de Bordeaux, Universite Bordeaux I, Pessac,
FRANCE; M.A. O'Keefe, E.C. Nelson, National Center for Electron
Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA;
L. Croguennec, C. Delmas, Institut de Chimie de la Matiere Condensee
de Bordeaux-CNRS and Ecole Nationale Superieure de Chimie et Physique
de Bordeaux, Universite Bordeaux I, Pessac, FRANCE.
9:30 AM G1.4
FLUCTUATION MICROSCOPY STUDIES OF ALUMINUM OXIDES EXPOSED TO Cl
IONS. Xidong Chen, Cedarville Univ & Argonne National
Lab, Cedarville, OH; John Sullivan, Charles Barbour, Craig Johnson,
Sandia National Lab, Albuquerque, NM; Guangwen Zhou, Judith Yang,
Univ of Pittsburgh, Pittsburgh, PA.
9:45 AM G1.5
ALOOF TRANSMISSION EELS, AND ITS APPLICATION TO NANOSTRUCTURES
FOR ELECTROMAGNETIC NANOMEASUREMENTS. Bryan W. Reed and
Mehmet Sarikaya, Materials Science and Engineering, University
of Washington, Seattle, WA.
10:00 AM BREAK
10:30 AM G1.6
ANALYSIS OF NANOMETER-SCALE CHEMICAL AND STRUCTURAL INHOMOGENEITY
BY TRANSMISSION ELECTRON MICROSCOPY. R.M. Stroud, Naval
Research Laboratory, Washington, DC.
10:45 AM G1.7
HIGH RESOLUTION EELS WITH A NEW MONOCHROMIZED TEM APPLIED TO NANOSCALE
STRUCTURE STUDIES. Gerald Kothleitner, Christoph Mitterbauer,
Ferdinand Hofer, Graz University of Technology, Research
Institute for Electron Microscopy, Graz, AUSTRIA; Henny Zandbergen,
Delft University of Technology, Delft, THE NETHERLANDS; Peter
Tiemeijer, Bert Freitag, FEI Electron Optics, Eindhoven, THE NETHERLANDS.
11:00 AM G1.8
QUANTIFICATION OF DISPLACEMENT FIELDS FROM LATTICE IMAGES (HREM)
AND ELECTRON EXIT WAVES IN NANOSTRUCTURED COMPOSITE OXIDES. H.A.
Calderon, A. Huerta, Dept. Ciencia de Materiales, ESFM-IPN,
Mexico D.F., MEXICO; C. Kisielowski, R. Kilaas, NCEM-LBNL, Berkeley
CA.
11:15 AM G1.9
ELECTRONIC STRUCTURE, OPTICAL PROPERTIES, LONDON DISPERSION FORCES
AND FULL SPECTRAL HAMAKER COEFFICIENTS FOR NANOSTRUCTURED INTERFACES
IN STRONTIUM TITANATE. Roger H. French, DuPont Co., Central
Research, Experimental Station, Wilmington, DE; Lin K. Denoyer,
Deconvolution and Entropy Consulting, Ithaca, NY; Klaus van Benthem,
Wilfred Sigle, Max-Planck-Institut für Metallforschung, Stuttgart,
GERMANY; V. Adrian Parsegian, Rudolf Podgornik, National Institute
of Health, Laboratory of Physical and Structural Biology, Section
on Molecular Biophysics, Bethesda, MD.
11:30 AM G1.10
ELECTRONIC STRUCTURE OF GRAIN BOUNDARIES IN NITROGEN-DOPED ULTRANANOCRYSTALLINE
DIAMOND. James Birrell, University of Illinois at Urbana
Champaign, Dept of Materials Science and Engineering, Urbana,
IL; O. Auciello, J.E. Gerbi, J.M. Gibson, J.A. Carlisle, Argonne
National Laboratory, Materials Science Division, Argonne, IL.
11:45 AM G1.11
ATOMIC-SCALE IMAGING AND SPECTROSCOPY OF DOPANT ATOMS INSIDE CRYSTALLINE
MATERIALS. David Muller, Paul M. Voyles, Akira Ohtomo,
Harold Y. Hwang, John L. Grazul, Paul H. Citrin, Bell Labs, Lucent
Technologies, Murray Hill, NJ; Hans J. Gossmann, Agere Systems,
Murray Hill, NJ.
SESSION G2: OPTICALLY BASED PROBES: LUMINESCENCE AND RAMAN
Chair: Javier Piqueras
Monday Afternoon, December 2, 2002
Room 200 (Hynes)
1:30 PM *G2.1
SPATIALLY RESOLVED LUMINESCENCE IN SEMICON- DUCTORS. Sergei
Ostapenko, University of South Florida, Center for Microelectronics
Research, Tampa, FL.
2:00 PM *G2.2
NEAR-FIELD CATHODOLUMINESCENCE: CHARACTERI- ZATION OF OPTOELECTRONIC
PROPERTIES AT NANOMETER SCALE. L.J. Balk, R. Heiderhoff,
Department of Electronics, University of Wuppertal, Wuppertal,
GERMANY.
2:30 PM G2.3
CATHODOLUMINESCENCE IN THE TRANSMISSION ELECTRON MICROSCOPE. Martin
Albrecht, T. Remmele, G. Frank, H.P. Strunk, Universität
Erlangen Nürnberg, Institut für Werkstoffwissenschaften,
Lehrstuhl Mikrocharakterisierung, Erlangen, GERMANY; K. Brand,
H. Lichte, Technische Universität Dresden, Dresden, GERMANY;
T. Walter, Landeszentrum für Hochleistungs Elektronenmikroskopie,
Institut für Anorganische Chemie, Universität Bonn,
GERMANY.
2:45 PM G2.4
EFFECT OF THERMAL AND MECHANICAL TREATMENTS ON THE CATHODOLUMINESCENCE
OF TIN AND TITANIUM OXIDES. D. Maestre, R. Plugaru, A. Cremades
and J. Piqueras Departamento de Fìsica de Materiales, Facultad
de Ciencias Fìsicas, Universidad Complutense, Madrid, SPAIN.
3:00 PM BREAK
3:30 PM *G2.5
RAMAN IMAGING OF LOCAL STRUCTURE IN SEMICON- DUCTOR DEVICES. Patrick
J. Treado, David D. Tuschel, ChemIcon Inc., Pittsburgh, PA.
4:00 PM G2.6
IMAGING AND SPECTROSCOPY OF GaN FILMS BY TWO-PHOTON EXCITATION.
J.W.P. Hsu, F.F. Schrey, and H.M. Ng, Bell Labs, Lucent
Technologies, Murray Hill, NJ.
4:15 PM G2.7
STUDY OF DOPING IN GaAs LAYERS BY LOCAL PROBE TECHNIQUES: MICRO-RAMAN,
MICRO-PHOTO- LUMINESCENCE AND CATHODOLUMINESCENCE. Angel Miguel
Ardila, Departamento de Física, Facultad de Ciencias, Universidad
Nacional de Colombia, Santa Fe de Bogotá, COLOMBIA and
Departamento de Física de la Materia Condensada, Facultad
de Ciencias, Universidad de Valladolid, Valladolid, SPAIN; Oscar
Martínez, Manuel Avella, Luis Felipe Sanz, Juan Jiménez,
Departamento de Fíisica de la Materia Condensada, Facultad
de Ciencias, Universidad de Valladolid, Valladolid, SPAIN; Bruno
Gérard, THALES, Corporate Research Laboratory, Orsay, FRANCE;
Jerome Napierala, Evelyne Gil-Lafon, LASMEA UMR CNRS, Université
Blaise Pascal, Les Cézeaux, Aubiére, FRANCE.
4:30 PM G2.8
MICRO-CHARACTERIZATION OF HIGH-QUALITY THICK ZnO CVD LAYERS. Axel
Hoffmann, Ute Haboeck, Martin Strassburg, Inst of Solid State
Physics, Technical Univ Berlin, Berlin, GERMANY; Till Riemann,
Frank Bertram, J. Christen, Inst of Experimental Physics, Otto-von-Guericke-Univ
Magdeburg, Magdeburg, GERMANY; Arndt Zeuner, Detlev Hofmann, Bruno
K. Meyer, I. Physikalisches Inst, Justus-Liebig-Univ Giessen,
Giessen, GERMANY.
4:45 PM G2.9
TEM-CATHODOLUMINESCENCE STUDIES OF QUANTUM STRUCTURES IN SEMICONDUCTOR
EPITAXIAL LAYERS. Naoki Yamamoto, Daigo Horiuchi, Hirotsugu
Itoh, Vincenzo Grillo, Tokyo Inst. of Tech., Dept. of Physics,
Tokyo, JAPAN.
SESSION G3: TUNNELING BASED PROBES OF SEMICONDUCTORS
Chair: Fredy R. Zypman
Tuesday Morning, December 3, 2002
Room 200 (Hynes)
8:30 AM *G3.1
HIGH SPATIAL RESOLUTION ULTRAFAST SCANNING TUNNELING MICROSCOPY.
Antoinette J. Taylor and Dzmitry A. Yarotski, Condensed
Matter and Thermal Physics Group, Los Alamos National Laboratory,
Los Alamos, NM.
9:00 AM G3.2
PROBING LOCALIZED AND PROPAGATING SURFACE PLASMONS BY STM-INDUCED
ELECTROLUMINESCENCE. S. Egusa, Y.-H. Liau, and N.F. Scherer,
Dept. of Physics, Dept of Chemistry, The James Franck Institute,
and MRSEC, The University of Chicago, Chicago, IL.
9:15 AM G3.3
SCANNING TUNNELING OPTICAL RESONANCE MICROSCOPY (STORM). Ryne
P. Raffaelle and Thomas Gennett, NanoPower Research Laboratories,
Rochester Institute of Technology, Rochester, NY; Janice E. Lau,
Phillip Jenkins, and Stephanie L. Castro, Ohio Aerospace Institute,
Brookpark, OH; Padetha Tin, National Center for Microgravity Research,
Case Western University, Cleveland, OH; David M. Wilt, Anna M.
Pal, and Sheila G. Bailey, NASA Glenn Research Center, Cleveland,
OH.
9:30 AM *G3.4
PROBING POTENTIAL DISTRIBUTIONS IN SEMICON- DUCTORS WITH THE SCANNING
TUNNELING MICROSCOPE. R.M. Feenstra, Y. Dong, Dept. Physics,
Carnegie Mellon University, Pittsburgh, PA; R. Hey, G. Meyer,
K.H. Ploog, Paul-Drude-Institut für Festkorperelektronik,
Berlin, GERMANY; M.P. Semtsiv, W.T. Masselink, Dept. of Physics,
Humboldt-Universite zu Berlin, Berlin, GERMANY; F. Moresco, K.H.
Rieder, Institut für Experi- mentalphysik, Freie Universite
Berlin, Berlin, GERMANY.
10:00 AM BREAK
SESSION G4: NEW PROBES OF NANOSCALE PROPERTIES
Chair: Fredy R. Zypman
Tuesday Morning, December 3, 2002
Room 200 (Hynes)
10:30 AM *G4.1
MEASURING AND CONTROLLING NANOMETER-SCALE PROPERTIES IN MOLECULES
AND ASSEMBLIES. P.S. Weiss, The Pennsylvania State University,
Department of Chemistry, University Park, PA.
11:00 AM G4.2
TOWARD NANOSCALE NUCLEAR MAGNETIC RESONANCE BY FORCE MICROSCOPY.
Sean R. Garner, Department of Physics, Cornell University;
Neil E. Jenkins, Lauren P. DeFlores, Tse Nga Ng, Seppe Kuehn,
Jahan M. Dawlaty, James G. Kempf, and John A. Marohn, Department
of Chemistry and Chemical Biology, Cornell University, Ithaca,
NY.
11:15 AM G4.3
REPRODUCIBILITY OF NANO- AND MICRO-SCALE MULTI-POINT PROBE SHEET
RESISTANCE MEASUREMENTS. Christian L. Petersen, Capres
A/S, Vancouver, BC, CANADA; Daniel Worledge, IBM T.J. Watson Research
Center, Yorktown Heights, NY; Peter R.E. Petersen, Capres A/S,
Lyngby, DENMARK.
11:30 AM G4.4
NANOIMPEDANCE SPECTROSCOPY. Rui Shao, Sergei V. Kalinin,
and Dawn A. Bonnell, Dept. of Materials Science and Engineering,
Univ. of Pennsylvania, Philadelphia, PA.
11:45 AM G4.5
DEVELOPMENT OF CANTILEVER BASED LORENTZ FORCE MICROSCOPY. Yutaka
Majima, Jun Ichihara, Atsushi Okuda, Tokyo Institute of Technology,
Dept. of Physical Electronics, Tokyo, JAPAN.
SESSION G5: SCANNING PROBE APPLICATIONS OF MICROSCOPIES
Chair: Sergei V. Kalinin
Tuesday Afternoon, December 3, 2002
Room 200 (Hynes)
1:30 PM G5.1
CHARACTERISATION OF NANOCRYSTALS BY KELVIN PROBE FORCE MICROSCOPY
AND SCANNING CAPACITANCE FORCE MICROSCOPY. Grazia Tallarida,
Sabina Spiga, Marco Fanciulli, Laboratorio MDM-INFM, Agrate Brianza,
Milan, ITALY.
1:45 PM G5.2
EXPERIMENTS AND SIMULATION OF NEAR FIELD SCANNING OPTICAL MICROSCOPY
OF FERROELECTRIC DOMAIN WALLS. S. Kim, V. Gopalan, Materials
Research Laboratory, Pennsylvania State University, University
Park, PA.
2:00 PM G5.3
BROADBAND NEAR-FIELD MICROWAVE MICROSCOPY OF Ba
Sr
TiO
THIN FILMS. A. Tselev,
S.M. Anlage, and R. Ramesh, MRSEC and Center for Superconductivity
Research, Physics Department, University of Maryland, College
Park, MD.
2:15 PM G5.4
KELVIN PROBE MICROSCOPY AND CATHODO- LUMINESCENCE MICROANALYSIS
OF THE IRRADIATION INDUCED MODIFICATION OF INSULATING MATERIALS.
Marion A. Stevens-Kalceff, School of Physics, University
of New South Wales, Sydney, NSW, AUSTRALIA.
2:30 PM G5.5
CHARACTERIZATION OF HIGH-k DIELECTRIC FILMS WITH TUNNELING AFM.
Xiang-Dong Wang, Joe Kulik, N.V. Edwards, Shifeng Lu, Motorola,
DigitalDNA Laboratories, Mesa, AZ; S.B. Samavedam, Motorola, DigitalDNA
Laboratories, Austin, TX.
2:45 PM G5.6
SPATIAL VARIATION IN CURRENT DENSITY OBSERVED USING MAGNETIC FORCE
MICROSCOPY. Ruchirej Yongsunthon, Andrei Stanishevsky,
and Ellen D. Williams, University of Maryland, College Park, MD;
P.J. Rous, University of Maryland, Baltimore County, MD.
3:00 PM BREAK
SESSION G6: SCANNING PROBE BASED MECHANICAL PROPERTY MEASUREMENTS
Chair: Sergei V. Kalinin
Tuesday Afternoon, December 3, 2002
Room 200 (Hynes)
3:30 PM *G6.1
TOWARD MEASURING SINGLE MOLECULE ELECTRO- DYNAMIC FIELDS. Steven
Eppell, Brian Todd, Case Western Reserve Univ, Dept of Biomedical
Engineering, Cleveland, OH; Fredy Zypman, Yeshiva Univ, Dept of
Physics, New York, NY.
4:00 PM G6.2
NANOINDENTATION: TOWARDS THE SENSING OF ATOMIC BOND ENERGIES.
Sergi Garcia-Manyes, Pau Gorostiza, Fausto Sanz, Bioelectronics
& Nanobioscience Research Center, University of Barcelona,
SPAIN; J. Fraxedas, Material Science Research Institute of Barcelona,
CSIC, Bellaterra, SPAIN.
4:15 PM G6.3
QUANTITATIVE EVALUATION OF ELASTOMER BLENDS BY ATOMIC FORCE MICROSCOPY.
David Weston, Rich Czerw, David L. Carroll, Clemson University,
Dept of Materials Science and Engineering, Clemson, SC.
4:30 PM G6.4
ACOUSTIC MEASUREMENTS FOR NANOMECHANICAL TEST INSTRUMENTS. Antanas
Daugela, Oden L. Warren, Thomas J. Wyrobek, Hysitron Inc,
Minneapolis, MN.
4:45 PM G6.5
IN-PLANE MATERIAL ANISOTROPY REVEALED BY INTERMITTENT CONTACT
ATOMIC FORCE MISCROSCOPY. Matthew S. Marcus, Univ of Wisconsin-Madison,
Dept of Physics, Madison, WI; Robert W. Carpick, Univ of Wisconsin-Madison,
Dept of Engineering Physics, Materials Science Program, and Rheology
Research Center, Madison, WI; Darryl Y. Sasaki, Sandia National
Laboratories, Biomolecular Materials and Interface Science, Albuquerque,
NM; M.A. Eriksson, Univ of Wisconsin-Madison, Dept of Physics,
Madison, WI.
SESSION G7: POSTER SESSION
NANOSCALE PHENOMENA IN MATERIALS AND DEVICES
Tuesday Evening, December 3, 2002
8:00 PM
Exhibition Hall D (Hynes)
G7.1
Abstract Withdrawn
G7.2
CHARACTERIZATION OF Au-Cu BINARY ALLOY NANOPARTICLES. G. Malyavanatham,
D.T. O'Brien, W.T. Nichols, M.F. Becker D. Kovar, and J.W. Keto,
Texas Materials Institute, University of Texas at Austin, Austin,
TX.
G7.3
IMPROVED RESOLUTION IN MFM IMAGING WITH NANOTUBE MODIFIED TIPS.
Amol Patil, Department of Materials Science and Engineering;
Andrew G. Rinzler, Department of Physics, University of Florida,
Ganiesville, FL.
G7.4
DEPTH RESOLVED IMAGING OF YELLOW LUMINESCENCE IN LATERAL EPITAXIAL
OVERGROWN GaN USING IONOLUMINESCENCE. E.J. Teo, A.A. Bettiol,
Research Centre for Nuclear Microscopy, Dept of Physics, National
University of Singapore; Y.Y. Liu, C.H. Phang, Centre for Integrated
Circuit Failure Analysis and Reliability, Dept of Electrical and
Electronic Engineering, National University of Singapore, SINGAPORE;
Zhang Ji, Centre for Optoelectronics, National University of Singapore,
SINGAPORE; M.S. Hao, Institute of Materials Research and Engineering.
G7.5
Abstract Withdrawn
G7.6
STM-REBIC STUDY OF NANOCRYSTALLINE AND CRYSTALLINE SILICON. E.
Nogales, B. Méndez, J. Piqueras, R. Plugaru, Dept.
Física de Materiales, Facultad de Ciencias Físicas,
Univ. Complutense de Madrid, Madrid, SPAIN.
G7.7
EXTRACTING IMPURITY POSITION IN NANO-WIRES FROM SCANNING TUNNELING
MICROSCOPY. Jeremy Stein, Fredy R. Zypman, Yeshiva University,
Department of Physics, New York, NY.
G7.8
MICROSTRUCTURAL ANALYSIS OF RUTILE TiO
-Sn
NANOCRYSTALS. Xiang-Cheng Sun, D.E. Nikles, Center for
Materials for Information Technology, The University of Alabama,
Tuscaloosa, AL; F. Pedraza, Instituto Mexicano del Petroleo, D.F.
MEXICO.
G7.9
CHARACTERIZATION OF STRAIN AND COMPOSITION IN COHERENT ISLANDS
USING TRANSMISSION ELECTRON MICROSCOPY. Chuan-Pu Liu, Department
of Materials Science and Engineering, National Cheng-Kung University,
Tainan, TAIWAN.
G7.10
CORRELATION LENGTH AND MEASURING MEDIUM RANGE ORDER IN AMORPHOUS
MATERIALS. P. Keblinski, R.K. Dash, Materials Science and
Engineering Department, Rensselaer Polytechnic Institute, Troy,
NY; P. Voyles, Bell Laboratories, Murray Hill, NJ; M. Gibson,
Advanced Photon Source, Argonne National Laboratory, Argonne,
IL; and M.M. Treacy, NECI, Princeton, NJ.
G7.11
Abstract Withdrawn
G7.12
DEFORMATION-ASSISTED NANOCRYSTALLIZATION IN A METALLIC GLASS STUDIED
BY NANOINDENTATION AND TRANSMISSION ELECTRON MICROSCOPY. W.H.
Jiang, Department of Nuclear Engineering and Radiological
Sciences, and M. Atzmon, Department of Nuclear Engineering and
Radiological Sciences & Department of Materials Sciences and
Engineering, University of Michigan, Ann Arbor, MI.
G7.13
HIGH-RESOLUTION MICROSCOPIC CHARACTERIZATION OF SHEAR BANDS FORMED
IN Al-RICH METALLIC GLASS BY COMPRESSION AND TENSION. W.H.
Jiang, Department of Nuclear Engineering and Radiological
Sciences, and M. Atzmon, Department of Nuclear Engineering and
Radiological Sciences & Department of Materials Sciences and
Engineering, University of Michigan, Ann Arbor, MI.
G7.14
FIB-TEM CHARACTERIZATION OF LOCALLY RESTRICTED IMPLANTATION DAMAGE.
Heinz D. Wanzenboeck, Stefan Harasek, Helmut Langfischer,
Emmerich Bertagnolli, Vienna University of Technology, Institute
for Solid State Physics, Vienna, AUSTRIA; Ulf Grabner, Gerold
Hammer, Peter Pongratz, Vienna University of Technology, Institute
for Solid State Physics, Vienna, AUSTRIA.
G7.15
ANALYTICAL AND HIGH-RESOLUTION TEM CHARACTERIZATIONS FOR NANOSCALE
FRACTURED INTERFACES IN 256MBIT DRAM DEVICES. Wei (Wayne) Zhao,
Infineon Technologies Richmond, Department of Technology Transfer,
Sandston, VA.
G7.16
CATHODOLUMINESCENCE STUDY OF RARE-EARTH DOPED GaSb. Pedro Hidalgo,
Bianchi Méndez, Javier Piqueras, Universidad Complutense,
Dept Física de Materiales, Madrid, SPAIN; José L.
Plaza and Ernesto Dieguez, Universidad Autónoma, Dept Física
de Materiales, Madrid, SPAIN.
G7.17
CATHODOLUMINESCENCE AND MICRO-RAMAN STUDY OF GaN ELO STRUCTURES.
O. Martinez, M. Avella, J. Jimenez, Dpto. Fisica de la
Materia Condensada, E.T.S.I.I., Valladolid, SPAIN; B. Gerard,
THALES Research and Technology, Domaine de Corbeville, Orsay,
FRANCE; S. Galloway, Gatan UK, Oxford, UNITED KINGDOM.
G7.18
Abstract Withdrawn
G7.19
Abstract Withdrawn
G7.20
LOCATION OF CURRENT CARRYING FAULTS IN INTEGRATED CIRCUITS BY
MAGNETIC FORCE MICROSCOPY. Anle Pu, A. Rahman, D.J. Thomson,
G.E. Bridges, University of Manitoba, Dept of Electrical and Computer
Engineering, Winnipeg, Manitoba, CANADA.
G7.21
A SCANNING TUNNELING MICROSCOPY AND POTENTIOMETRY STUDY OF EPITAXIAL
AND POLYCRYSTALLINE THIN FILMS OF
.
Mandar Paranjape, K. Shantha Shankar, A.K. Raychaudhuri,
Dept of Physics, Indian Institute of Science, Bangalore, INDIA;
N.D. Mathur, M.G. Blamire, Department of Materials Science and
Engineering, Cambridge University, Cambridge, UNITED KINGDOM.
G7.22
APPLICATION OF STEREOLOGY TO THE STATISTICAL DESCRIPTION OF THE
SPATIAL DISTRIBUTION OF SCALAR PROPERTIES IN THREE DIMENSIONAL
STRUCTURES. R.T. DeHoff, University of Florida, Dept of
Materials Science and Engineering, Gainesville, FL.
G7.23
STM-LIGHT EMISSION FROM Si(111) AND GaAs(110) SEMICONDUCTOR SURFACES.
Masanori Hoshino, Tsuyoshi Takeuchi, Shigeru Kagami, Naoki
Yamamoto, Tokyo Inst. of Tech., Dept. of Materials Science
and Engineering, Tokyo, JAPAN.
G7.24
CHARACTERIZATION OF ZnO FILMS BY SCANNING TUNNELING SPECTROSCOPY
AND BEAM-INDUCED CURRENT IN THE SCANNING TUNNELING MICROSCOPE.
A. Urbieta, P. Fernandez, J. Piqueras, Departamento de
Fisica de Materiales, Facultad de Ciencias Fisicas, Universidad
Complutense de Madrid, Madrid, SPAIN; E. Vasco, C. Zaldo, Instituto
de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, Madrid,
SPAIN.
G7.25
DISLOCATION-MEDIATED MECHANISMS OF MASS TRANSPORT AROUND NANOINDENTATIONS
IN FCC METALS. O. Rodriguez de la Fuente, E. Carrasco,
M.A. Gonzalez, J.M. Rojo, Universidad Complutense, Departamento
Fisica de Materiales, Madrid, SPAIN.
G7.26
DETERMINATION OF THE PLASTIC BEHAVIOR OF LOW THERMAL EXPANSION
GLASS AT THE NANOMETER SCALE. Richard Tejeda, Roxann Engelstad,
and Edward Lovell, University of Wisconsin, Computational
Mechanics Center, Madison, WI; Anthony Anderson and Dehua Yang,
Hysitron, Inc., Minneapolis, MN; Kenneth Blaedel, Lawrence Livermore
National Laboratory, Livermore, CA.
G7.27
NANO-SCALE DUCTILITY OF GLASS AS EVIDENCED BY ATOMIC FORCE MICROSCOPY
EXPERIMENTS. Fabrice Célarié, Daniel Bonamy, Lorenzo
Ferrero, Christian Marlière, Laboratoire des Verres,
UMR CNRS 5587, University Montpellier 2, FRANCE; Silke Prades,
Elisabeth Bouchaud, Claude Guillot, Service de Physique et Chimie
des Surfaces et Interfaces, CEA Saclay, FRANCE.
G7.28
VARIABLE-TEMPERATURE ELECTRIC FORCE MICROSCOPY OF ORGANIC THIN
FILM DEVICES. Erik M. Muller, William R. Silveira, Neil
Jenkins, Jenna Harang, John A. Marohn, Cornell University, Department
of Chemistry and Chemical Biology, Ithaca, NY.
G7.29
NANOSCALE MEASUREMENTS AND MODELING OF PIEZOELECTRIC-FORCE MICROSCOPY
OF DOMAIN WALL WIDTHS IN FERROELECTRICS. David A. Scrymgeour
and Venkatraman Gopalan, Pennsylvania State University, Materials
Research Laboratory, University Park, PA; Alexei Gruverman, North
Carolina State University, Raleigh, NC.
G7.30
LOCALIZED CROSS-SECTIONING OF CARBON NANOTUBE-TO-METAL JUNCTIONS
FOR HIGH SPATIAL RESOLUTION CHEMICAL AND STRUCTURAL ANALYSIS.
K. Dovidenko, J. Rullan, University at Albany-SUNY, School
of NanoSciences and NanoEngineering, UAlbany Institute for Materials,
Albany, NY; N.L. Abramson, Union College, Schenectady, NY.
G7.31
ELECTRONIC AND OPTICAL CHARACTERISTICS OF PPV NANOTUBES. J.H.
Park, Y.W. Park, Seoul National Univ, Nano Transport Lab,
Seoul, KOREA; K. Kim, J.I. Jin, Cntr Electro-Photo-Responsive
Molecules, Korea Univ, KOREA; S. Webster, J. Liu, R. Czerw, D.L.
Carroll, Dept. of Mat. Eng. and Science, Clemson Univ, Clemson,
SC.
G7.32
A COMPARISON OF SCANNING IMPEDANCE AND SCANNING GATE MICROSCOPIES
FOR DETERMINING PROPERTIES OF INDIVIDUAL DEFECTS IN MOLECULAR
CIRCUITS. Sergei V. Kalinin and Dawn A. Bonnell, Dept.
of Materials Science and Engineering, Univ. of Pennsylvania, Philadelphia,
PA; Marcus Freitag and A.T. Johnson, Dept. of Physics and Astronomy,
Univ. of Pennsylvania, Philadelphia, PA.
G7.33
ORGANIC MOLECULES ACTING AS NANOMOLDS ON Cu(110). Federico
Rosei, Y. Naitoh, M. Schunack, E. Legsgaard, I. Stensgaard,
and F. Besenbacher, Physics Department and I-NANO, University
of Aarhus, DENMARK; P. Jiang, A. Gourdon, and C. Joachim CEMES-CNRS,
Toulouse, FRANCE.
G7.34
LOCAL DYNAMICS OF POLYMERS IN INTERCALATED ORGANIC/INORGANIC NANOSTRUCTURES.
Virkam Kuppa, Evangelos Manias, Penn State University,
Dept of Materials Science & Engineering, University Park,
PA.
G7.35
CASIMIR FORCES BETWEEN NANOPARTICLES AND SUBSTRATES. Carlos E.
Roman-Velazquez, CICATA, Mexico D.F., MEXICO; Cecilia Noguez,
Carlos Villarreal, and Raul Esquivel-Sirvent. Instituto de Fisica,
UNAM, Mexico D.F., MEXICO.
G7.36
OBSERVATION OF THE MORPHOLOGY OF ZnO:Al NANOCOATING BY PULSED
LASER DEPOSITION ON ZnS:Ag PHOSPHOR FOR DEGRADATION REPRESSION.
Sanshiro Nagare, Nara Machinery Co., Ltd, Tokyo, JAPAN;
Mamoru Senna, Keio University, Faculty of Science and Technology,
Yokohama, JAPAN; Michael Ollinger, Rajiv Singh, University of
Florida, Department of Materials Science and Engineering, Gainesville,
FL.
G7.37
MICROTWINNING AND TWIN RELATED STRUCTURES IN TEMPLATE SYNTHESIZED
METAL NANOWIRES. Jinguo Wang, Mingliang Tian, Thomas E.
Mallouk and Moses H.W. Chan, Materials Research Institute and
Center for Collective Phenomena in Restricted Geometries, Penn
State University, University Park, PA.
G7.38
ION BEAM CHANNELING CHARACTERIZATION OF SPATIAL STRUCTURES OF
SELF-ASSEMBLED InAs QUANTUM DOTS IN GaAs. Jie Zhu, Xiaotang Ren
and Mengbing Huang, Univ at Albany-SUNY, Albany, NY.
G7.39
ETCHING OF CARBON NANOTUBES BY STEAM ACTIVATION. Rodney Andrews,
Dali Qian, Rolando Gonzalez, David Jacques, University
of Kentucky, Center for Applied Energy Research, Lexington, KY;
Olivier de Verclos, University of Burgundy at Dijon, ESIREM Engineering
School, FRANCE.
G7.40
ANALYSIS OF STACKING STRUCTURE OF CUP-STACKED TYPE CARBON NANOFIBERS.
Kyoichi Oshida, Tatsuo Nakazawa, Kozo Osawa, Nagano National
College of Technology, Nagano, JAPAN; Takuya Hayashi, Morinobu
Endo, Faculty of Engineering, Shinshu Univ., Nagano, JAPAN.
G7.41
THE ELEMENT DEPTH PROFILES IN ULTRATHIN SILICON OXINITRIDE FILMS.
I. Asanov, Y.S. Jung, J.Y. Won, J.H. Choi, J.C. Lee, C.B.
Lim, Analytical Engineering Center, Samsung Advanced Institute
of Technology, Suwon, KOREA; D.W. Moon, Nano Surface Group, Korea
Research Institute of Standards and Science, Daejeon, KOREA.
G7.42
SYNTHESIS AND CHARACTERIZATION OF Si
Ge
NANOWIRES. K.W. Adu, R.
Gupta, G.U. Sumanesakera, B.K. Pradhan, P.C. Eklund, Dept. of
Physics, Pennsylvania State University, University Park, PA.
SESSION G8: SIZE DEPENDENT BEHAVIOR OF NANO PARTICLES
Chair:
Wednesday Morning, December 4, 2002
Room 200 (Hynes)
8:30 AM G8.1
NANOCALORIMETRIC CHARACTERIZATION OF THE SIZE DEPENDENT MELTING
PROPERTIES OF CdSe QUANTUM DOTS. J. Rodriguez-Viejo, M.
Chacon, A.F. Lopeandia, M.T. Clavaguera-Mora, Universidad Autonoma
de Barcelona, Physics Dep., Bellaterra, SPAIN; Leonel R. Arana,
K.F. Jensen, Dep.of Chemical Engineering, Massachusetts Institute
of Technology, Cambridge, MA; H. Mattoussi, U.S. Naval Research
Lab, Optical Science Division, Washington, DC.
8:45 AM G8.2
ADVANCED
C NUCLEAR MAGNETIC
RESONANCE INVESTIGATION OF METAL-LIGAND INTERACTIONS IN MONOLAYER-PROTECTED
GOLD NANOPARTICLES: NMR SHIFTS AND RELAXATIONS. Brian S. Zelakiewicz,
YuYe Tong, Georgetown University, Department of Chemistry, Washington,
DC.
9:00 AM G8.3
NOVEL PHENOMENA OF ELECTRIC PERMITTIVITY OF NANO-COMPOSITE. Jin-Ho
Kang, Chan Eon Park, Pohang University of Science and Technology,
Polymer Research Institute, Department of Chemical Engineering,
Division of Electrical and Computer Engineering, Pohang, KOREA.
9:15 AM G8.4
TRANSITION FROM MOLECULAR/AMORPHOUS TO POLYCRYSTALLINE BEHAVIOR
IN Si NANOPARTICLES. G. Belomoin, J. Therrien, M.H. Nayfeh,
Univ of Illinois, Dept of Physics, Urbana, IL; M. Alsalhi, A.Al
Aql, King Saud Univ, Dept of Physics, Riyadh, SAUDI ARABIA.
9:30 AM G8.5
STRUCTURAL AND ELEMENTAL CHARACTERIZATION OF Fe/Co NANO-PARTICLES
PRODUCED THROUGH ORGANOMETALLIC SYNTHESIS. P.L. Fejes,
Motorola Inc., Semiconductor Products Sector, Tempe, AZ; F. Dumestre,
C. Amiens, LCC-CNRS, Toulouse, FRANCE; P. Renaud, Motorola Inc.,
Semiconductor Products Sector, Toulouse, FRANCE; B. Chaudret,
LCC-CNRS, Toulouse, FRANCE; P. Zurcher, Motorola Inc., Semiconductor
Products Sector, Tempe, AZ.
9:45 AM G8.6
TEM INVESTIGATIONS OF SHELL/CORE STRUCTURE OF BORON-OXIDE-COATED
Fe(B) NANOCAPSULES. J.G Zheng, Electron Probe Instrumentation
Center, Department of Materials Science and Engineering, Northwestern
University, Evanston, IL; Z.D. Zhang, J.L. Yu, Shenyang National
Laboratory for Materials Science and International Center for
Materials Physics, Institute of Metal Research, Academic Sinica,
Shengyany, P.R. CHINA; V.P. Dravid, Electron Probe Instrumentation
Center, Department of Materials Science and Engineering, Northwestern
University, Evanston, IL.
10:00 AM BREAK
10:30 AM G8.7
THE USE OF SURFACE ENHANCED RAMAN SCATTERING FOR THE DETECTION
OF DIPICOLINIC ACID ON SILVER NANOPARTICLES. Joseph Miragliotta,
Terry E. Phillips, Peter F. Scholl, Johns Hopkins University,
Applied Physics Laboratory, Laurel, MD.
10:45 AM G8.8
OPTICAL GAIN AND STIMULATED EMISSION IN SILICON NANOCRYSTALS.
L. Dal Negro
, M.
Cazzanelli
, N. Daldosso
,
Z. Gaburro
, L. Pavesi
,
F. Priolo
, G. Franzo
,
D. Pacifici
and F. Iacona
;
INFM-Dipartimento
di Fisica, Universita di Trento, Povo, ITALY;
INFM-Dipartimento
di Fisica, Universita di Catania, Catania, ITALY;
CNR-IMM,
Catania, ITALY.
11:00 AM G8.9
SURFACE MODIFICATION AND OPTICAL BEHAVIOR OF TiO
NANOSTRUCTURES. S.M. Prokes, Naval Research Laboratory,
Washington, DC; James L. Gole, Department of Physics, Georgia
Institute of Technology, Atlanta, GA; Chunxing She and T. Lian,
Department of Chemistry, Emory University, Atlanta, GA.
11:15 AM G8.10
ORGANIC LIGHT EMITTING DEVICES FABRICATED FROM SEMICONDUCTING
NANOSPHERES. Thomas Piok, Stefan Gamerith, Christoph Gadermaier,
Emil J.W. List, Christian Doppler Laboratory, Advanced Functional
Materials, Institute of Solid State Physics, Graz University of
Technology, Graz, AUSTRIA, and Institute of Nanostructured Materials
and Photonics, Weiz, AUSTRIA; Ullrich Scherf, Institute of Physical
Chemistry, University of Potsdam, Golm, GERMANY; Katharina Landfester,
Max Planck Institute of Colloids and Interfaces, Research Campus
Golm, Potsdam, GERMANY.
11:30 AM G8.11
INFLUENCE OF SUBSTRATE ON IN-PLANE ELECTRICAL CONDUCTION OF CuPc
NANO-CRYSTALS. Masakazu Nakamura, Tsuyoshi Maruyama, Masatoshi
Watanabe, Masaaki Iizuka, Kazuhiro Kudo, Chiba Univ, Dept of Electronics
and Mechanical Engineering, Chiba, JAPAN.
SESSION G9/NN6: JOINT SESSION
NANO AND MOLECULAR ELECTRONICS
Chair: Dawn A. Bonnell
Wednesday Afternoon, December 4, 2002
Room 200 (Hynes)
1:30 PM *G9.1/NN6.1
ELECTRONIC CHARACTERIZATION OF SINGLE DEFECTS IN ONE-DIMENSIONAL
NANOSTRUCTURES. A.T. Johnson, Marcus Freitag, University
of Pennsylvania, Dept of Physics and Astronomy, Philadelphia,
PA; Sergei V. Kalinin, Dawn A. Bonnell, University of Pennsylvania,
Dept of Materials Science and Engineering, Philadelphia, PA.
2:00 PM G9.2/NN6.2
AFM-BASED ELECTRICAL CHARACTERIZATION OF NANOSTRUCTURES. Sandra
B. Schujman, Sujit K. Biswas, Dept. of Physics, Applied
Physics and Astronomy; Robert Vajtai, Bingqing Wei, Dept. of Materials
Science and Engineering; Leo J. Schowalter, Dept. of Physics,
Applied Physics and Astronomy; Pulickel M. Ajayan, Dept. of Materials
Science and Engineering, Rensselaer Polytechnic Institute, Troy,
NY.
2:15 PM G9.3/NN6.3
INTERFACE EFFECTS ON ELECTRICAL PROPERTIES OF CARBON NANOTUBES.
Pridhudev Manghat, Jaewu Choi, Dept of Electrical and Computer
Engineering, Wayne State Univ, Detroit, MI.
2:30 PM G9.4/NN6.4
NEGATIVE DIFFERENTIAL RESISTANCES IN NANOMECHANICAL DOUBLE BARRIER
TUNNELING JUNCTIONS WITH C
MOLECULES
AT ROOM TEMPERATURE. Kouhei Nagano
,
Yasuo Azuma
, Yutaka Majima
;
Tokyo
Institute of Technology, Dept. of Physical Electronics,
Organization and Function, PRESTO,
Japan Science and Technology Corporation (JST), Tokyo, JAPAN.
2:45 PM G9.5/NN6.5
QUANTUM CONFINEMENT ON THE VIBRATIONAL PROPERTIES OF SILICON NANOWIRES.
C.K.A. Adu, G.U. Sumanasekera, B.K. Pradhan, and P.C. Eklund,
Dept. of Physics, Pennsylvania State University, University Park,
PA; J.E. Fischer, Department of Material Science and Engineering
and Laboratory for Research on the Structure of Matter, University
of Pennsylvania, Philadelphia, PA.
3:00 PM BREAK
3:30 PM G9.6/NN6.6
PERIODIC ARRAYS OF INTRAMOLECULAR JUNCTIONS OF SILICON NANOWIRES.
Duoduo Ma, Shuittong Lee, City Univ of Hong Kong, Dept
of Physics and Materials Science, Hong Kong, CHINA.
3:45 PM G9.7/NN6.7
SINGLE MOLECULE SWITCHES. Z.J. Donhauser, P.S. Weiss, The
Pennsylvania State University, University Park, PA.
4:00 PM G9.8/NN6.8
SCANNING TUNNELING SPECTROSCOPY OF SINGLE COMPLEX MOLECULES AND
ORDERED MOLECULAR NANOSTRUCTURES AT ROOM TEMPERATURE. Federico
Rosei, Y. Naitoh, M. Schunack, E. Legsgaard, I. Stensgaard,
and F. Besenbacher, Physics Department and I-NANO, University
of Aarhus, DENMARK; P. Jiang, A. Gourdon, and C. Joachim CEMES-CNRS,
Toulouse, FRANCE.
4:15 PM G9.9/NN6.9
SINGLE MOLECULAR CONDUCTIVITY OF ORDERED NANOWIRES. M. Hadi Zareie,
Hong Ma, Bryan W. Reed, Alex Jen, and Mehmet Sarikaya,
Materials Science and Engineering, University of Washington, Seattle,
WA.
4:30 PM G9.10/NN6.10
ELECTRON TRANSPORT THROUGH CONJUGATED ORGANIC MOLECULES. Ganesh
K. Ramachandran, John K. Tomfohr, Otto F. Sankey and Stuart
M. Lindsay, Department of Physics and Astronomy, Arizona State
University, Tempe, AZ; Xristo Zarate, Alex Primak, Tom A. Moore,
Ana L. Moore and Devens Gust, Department of Chemistry and Biochemistry,
Arizona State University, Tempe, AZ; and Larry A. Nagahara, Physical
Sciences Research Laboratory, Motorola Labs, Tempe, AZ.
4:45 PM G9.11/NN6.11
COMBINED STM, UPS AND THEORETICAL INVESTIGATIONS OF THE ELECTRONIC
COUPLING EFFICIENCY OF VARIOUS ANCHORING GROUPS FOR MOLECULAR
ELECTRONICS. L. Patrone, S. Palacin, F. Armand, J.P. Bourgoin,
Service de Chimie Moléculaire, CEA Saclay, FRANCE; J. Lagoute,
S. Gauthier, H. Tang, CEMES CNRS, Toulouse, FRANCE; N. Stuhr-Hansen,
T. Bjornholm, Department of Chemistry, Copenhagen University,
DENMARK.
SESSION G10: BIOLOGICAL SYSTEMS AT
THE NANOSCALE
Chair: Paul S. Weiss
Thursday Morning, December 5, 2002
Room 200 (Hynes)
8:45 AM G10.1
FLUORESCENT NANOCRYSTAL PROBES FOR CELL SURFACE RECEPTORS. Sandra
J. Rosenthal, Ian Tomlinson, Jon Burton, Jesse Grey, Department
of Chemistry, Vanderbilt University, Jon Mason, Paul Gresch, Elaine
Sanders-Bush, Lou DeFelice, and Randy Blakely, Department of Pharmacology
and Center for Molecular Neuroscience, Vanderbilt University Medical
School, Nashville, TN.
9:00 AM G10.2
AFM STUDY OF MECHANICAL AND STRUCTURAL PROPERTIES OF STRATUM CORNEUM.
Yonghui Yuan, Ritu Verma, Unilever Research, Edgewater,
NJ.
9:15 AM G10.3
DISCRIMINATION OF BIOMOLECULAR CONFORMATION USING THE SCANNING
KELVIN PROBE TECHNIQUE. Douglas C. Hansen, Princeton Applied
Research, Oak Ridge, TN; Karolyn M. Hansen, Thomas L. Ferrell
and Thomas G. Thundat, Oak Ridge National Laboratory, Life Sciences
Division, Oak Ridge, TN.
9:30 AM *G10.4
SEGMENTED NANOFIBERS OF SPIDER DRAGLINE SILK: ATOMIC FORCE MICROSCOPY
AND SINGLE-MOLECULE FORCE SPECTROSCOPY. Helen Hansma, Emin
Oroudjev, Univ of Californa, Dept of Physics, Santa Barbara, CA.
10:00 AM BREAK
SESSION G11: LOCAL PROPERTIES OF SAMs
Chair: Paul S. Weiss
Thursday Morning, December 5, 2002
Room 200 (Hynes)
10:30 AM G11.1
Transferred to G13.16
10:45 AM G11.2
MORPHOLOGY AND POLAR ORDER IN SELF-ASSEMBLED THIN FILMS OF OVERCROWDED
ARENES STUDIED BY SCANNING PROBE MICROSCOPY. Thuc-Quyen Nguyen,
Colin Nuckolls, Louis Brus, Chemistry Department, Columbia University,
New York, NY.
11:00 AM G11.3
SCANNING PROBE MICROSCOPY OF SELF-ASSEMBLED MONOLAYERS OF PHENYLENE/ETHYNYLENE
MOLECULES. R. Ross Getty, Simona Percec, Kenneth G. Sharp,
Roger H. French, Paula B. Hietpas, Gregory S. Blackman, DuPont
Experimental Station, Wilmington, DE; Tony Alvarez, Dawn A. Bonnell,
Department of Materials Science and Engineering, University of
Pennsylvania, Philadelphia, PA.
11:15 AM G11.4
SURFACE POTENTIAL IMAGING MECHANISMS OF SELF-ASSEMBLED MONOLAYERS.
Tony Alvarez, Dawn Bonnell, Univ of Pennsylvania, Dept
of Materials Science and Engineering, Philadelphia, PA; R. Ross
Getty, DuPont Experimental Station, Wilmington, DE.
11:30 AM G11.5
SFM AND TOF-SIMS STUDY OF UNCONVENTIONAL SELF-ORGANIZATION PHENOMENA
IN MIXED LB MONOLAYERS. Bruno Pignataro, Laura Sardone,
Antonino Licciardello, Giovanni Marletta, Dept of Chemical Science,
Catania, ITALY.
SESSION G12: OPTICAL PROBES OF NANOSTRUCTURES
Chair: Ludwig J. Balk
Thursday Afternoon, December 5, 2002
Room 200 (Hynes)
1:30 PM G12.1
WAVELENGTH-DEPENDENT RAMAN SCATTERING AND PHOTOLUMINESCENCE OF
HYDROGENATED AMORPHOUS SILICON CARBON FOR A CHARACTERIZATION OF
CLUSTER SIZE DEPENDENT PHENOMENA. Minseo Park, V. Sakhrani,
J.J. Cuomo, Department of Materials Science and Engineering, North
Carolina State University, Raleigh, NC; B.J. Rodriguez, R.J. Nemanich,
Department of Physics, North Carolina State University, Raleigh,
NC; C.W. Teng, J.F. Muth, Department of Electrical and Computer
Engineering, North Carolina State University, Raleigh, NC.
1:45 PM G12.2
MICRO-RAMAN SPECTROSCOPY OF SILICON NANOCRYSTALS PRODUCED BY PICOSECOND
PULSED LASER ABLATION. M.H. Wu, A. Ueda, R. Mu, D.O. Henderson,
Dept of Physics, Fisk University, Nashville, TN.
2:00 PM *G12.3
IMMERSION LENS MICROSCOPY OF PHOTONIC NANO- STRUCTURES AND QUANTUM
DOTS. M. Selim Ünlü, S.B. Ippolito, Z. Liu, B.B.
Goldberg, Boston Univ, Photonics Center, Dept of Physics and Electrical
Engineering, Boston, MA; Lukas Novotny, Univ of Rochester, Institute
of Optics.
2:30 PM G12.4
CONFOCAL OPTOELECTRONIC HOLOGRAPHY MICROSCOPE FOR MATERIALS AND
STRUCTURAL CHARACTERIZATION OF MEMS. Adam M. Siegel, Cosme
Furlong, and Ryszard J. Pryputniewicz, Mechanical Engineering
Department/CHSLT-NEST, Worcester Polytechnic Institute, Worcester,
MA.
2:45 PM G12.5
STRUCTURE AND STABILITY OF COLLOIDAL NETWORKS IN VISCOELASTIC
FLUIDS. Maria L. Kilfoil, David A. Weitz, Harvard University,
Div of Engineering and Applied Sciences, Cambridge, MA; Eugene
Pashkovski, Colgate-Palmolive, Piscataway, NJ.
3:00 PM BREAK
3:30 PM G12.6
USING A CONFOCAL MICROSCOPE SHEAR CELL TO STUDY DISLOCATION MOTION
IN A RANDOM-CLOSE-PACKED COLLOIDAL SUSPENSION. Itai Cohen,
David Weitz, Harvard University, Dept of Engineering and Applied
Sciences, Cambridge, MA; Thomas G. Mason, Exxon Mobile Research
and Engineering Co., Annandale, NJ.
3:45 PM *G12.7
THE PHOTOCHEMISTRY, STRUCTURE AND DYNAMICS OF DELOCALIZED CHARGES
AND TRIPLET EXCITONS IN ORGANIC THIN FILMS. Paul Barbara,
Jason McNeill, Doo Young Kim, Robin Lammi, and Ji Yu, Dept of
Chemistry & Biochemistry and the Center for Nano- and Molecular
Science and Technology, University of Texas, Austin, TX.
4:15 PM G12.8
NEAR-FIELD OPTICAL SPECTROSCOPY OF GOLD BASED-NANOSTRUCTURES.
A.A. Mikhailovsky, A.P. Bartko, M.A. Petruska and V.I.
Klimov, Chemistry Division, Los Alamos National Laboratory, Los
Alamos, NM.
4:30 PM G12.9
HIGH-RESOLUTION THERMOREFLECTANCE MICROSCOPY. Shawn Thorne,
Stephen Ippolito, Selim Unlu, Boston University, Dept of Electrical
and Computer Engineering, Boston, MA; Bennett Goldberg, Boston
University, Dept of Physics, Boston, MA.
SESSION G13: POSTER SESSION
Thursday Evening, December 5, 2002
8:00 PM
Exhibition Hall D (Hynes)
G13.1
SPATIALLY RESOLVED CHARACTERIZATION OF ELECTROMIGRATION-INDUCED
PLASTIC DEFORMATION IN Al(0.5wt% Cu) INTERCONNECTS. Rosa I.
Barabash, Gene E. Ice, Metals & Ceramics Division, ORNL,
Oak Ridge, TN; Nobumichi Tamura, Advanced Light Source, Berkeley,
CA; Bryan C. Valek, John C. Bravman, Dept. Materials Science &
Engineering, Stanford University, Stanford, CA; Jim R. Patel,
Advanced Light Source, Berkeley and Stanford Synchrotron Radiation
Laboratories, CA.
G13.2
Abstract Withdrawn
G13.3
IN-SITU TEM OBSERVATIONS OF PHASE TRANSFORMATION ON FePt-Cu NANOPARTICLES.
Xiang-Cheng Sun, D.E. Nikles, S.S. Kang, J.W. Harrell,
Center for Materials for Information Technology (MINT), The University
of Alabama, Tuscaloosa, AL; Z.R. Dai, Z.L. Wang, School of Materials
Science and Engineering, Georgia Institute of Technology, Atlanta,
GA.
G13.4
STRUCTURE AND ELECTRONIC PROPERTIES OF MOLECULARLY-CAPPED METAL
NANOPARTICLES: THE EFFECT OF NANO-SIZE, METAL CORE AND CAPPING
MOLECULES PROBED BY X-RAY ABSORPTION FINE STRUCTURE. Peng Zhang,
Tsun Kong Sham, Univ of Western Ontario, Dept of Chemistry, London,
Ontario, CANADA.
G13.5
SUBSTRATE DEPENDENCE OF SURFACE PLASMON RESONANCE FREQUENCY OF
SILVER ISLAND FILMS. Gang Xu, Masato Tazawa, Ping Jin,
AIST, Nagoya, JAPAN.
G13.6
A STUDY OF ULTRATHIN SiO
FILMS
ON SILICON BY SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY.
K. Xue, J.B. Xu, M.S. Xu, J. An, J. He, R.W.M. Kwok
, I.H. Wilson, and R.A.Devine
, Department of Electronic
Engineering, and Materials Science and Technology Research Center,
The Chinese University of Hong Kong;
Department
of Chemistry, The Chinese University of Hong Kong, Shatin, New
Territories, Hong Kong SAR;
Center
for High Technology Materials, University of New Mexico, Albuquerque,
NM.
G13.7
ATOMIC AND ELECTRONIC STRUCTURES OF Au/TiO
CATALYST - FIRST-PRINCIPLE CALCULATION. Kazuyuki Okazaki,
Shingo Tanaka (SWING), Satoshi Ichikawa, Koji Tanaka, Masanori
Kohyama, National Institute of Advanced Industrial Science and
Technology (AIST), Special Division of Green Life Technology,
Osaka, JAPAN; Yoshitada Morikawa, National Institute of Advanced
Industrial Science and Technology (AIST), Research Institute for
Computational Sciences, Tsukuba, JAPAN.
G13.8
STRAIN RELAXATION OF STRAINED-Si LAYERS ON SiGe-ON-INSULATOR(SGOI)
STRUCTURES AFTER MESA ISOLATION. Koji Usuda, Tomohisa Mizuno,
Tsutomu Tezuka, Naoharu Sugiyama, Yoshihiko Moriyama, Shu Nakaharai,
and Shin-ichi Takagi, MIRAI Project, ASET, Kawasaki, JAPAN.
G13.9
MAGNETIC DOMAIN STRUCTURES IN CoNiFe THIN FILMS AND LINES. Lucas
Perez, Oscar de Abril, M.C. Sanchez-Trujillo, Eloisa Lopez,
Universidad Complutense, Dept Fisica de Materiales, Madrid, SPAIN;
Claudio Aroca, Pedro Sanchez, Universidad Politecnica, ISOM and
Dpt. Fisica Aplicada, Madrid, SPAIN.
G13.10
NUMERICAL MODELING OF IN-PLANE EFFECTS IN INTERMITTENT CONTACT
ATOMIC FORCE MICROSCOPY. Matthew S. Marcus, M.A. Eriksson,
Univ of Wisconsin-Madison, Dept of Physics, Madison, WI; Darryl
Y. Sasaki, Sandia National Laboratories, Biomolecular Materials
and Interface Science, Albuquerque, NM; Robert W. Carpick, Univ
of Wisconsin-Madison, Dept of Engineering Physics, Materials Science
Program, and Rheology Research Center, Madison, WI.
G13.11
ATOMIC AND ELECTRONIC STRUCTURES OF NANO-INTERFACE IN Au/TiO
CATALYST - ELECTRON MICROSCOPIC
APPROACH. Satoshi Ichikawa, Kazuyuki Okazaki, Tomoki Akita,
Mitsutaka Okumura, Koji Tanaka, Masanori Kohyama, National Institute
of Advanced Industrial Science and Technology, AIST-Kansai, Osaka,
JAPAN.
G13.12
Abstract Withdrawn
G13.13
SURFACE FORCE MEASUREMENT WITH NANO-SIZED COLLOIDAL PROBE. Jeong-Min
Cho, Wolfgang M. Sigmund, University of Florida, Dept. of
Materials Science and Engineering, Gainesville, FL.
G13.14
SPATIALLY-RESOLVED ELECTRICAL PROPERTIES OF InAs/InP NANOSTRUCTURES.
K.O. Vicaro, H.R. Gutiérrez and M.A. Cotta, DFA/LPD,
IFGW, UNICAMP, Campinas, São Paulo, BRAZIL.
G13.15
DESIGN AND ANALYSIS OF MICROCANTILEVERS FOR BIOSENSING APPLICATIONS.
Cengiz S. Ozkan, Kambiz Vafai, University of California,
Riverside, Mechanical Engineering Department, Riverside, CA.
G13.16
CHEMICAL FORCE MICROSCOPIC STUDY OF UV EXCIMER LASER IRRADIATED
POLYAMIDE. Joanne Yip, K. Chan, K.M. Sin, Institute of
Textiles & Clothing, The Hong Kong Polytechnic University,
HONG KONG; K.S. Lau, Department of Applied Physics, The Hong Kong
Polytechnic University, HONG KONG.
SESSION G14/NN8: JOINT SESSION
PROCESSING AND PROPERTIES OF NANOWIRES
Chair: Andrew P. Shreve
Friday Morning, December 6, 2002
Room 200 (Hynes)
8:30 AM G14.1/NN8.1
RAMAN-ACTIVE PHONONS IN POLAR SEMICONDUCTING NANOWIRES. G.D.
Mahan and P.C. Eklund, Dept of Physics, Penn State University,
University Park, PA.
8:45 AM G14.2/NN8.2
DUAL-PROBE SCANNING TUNNELING MICROSCOPE AND A CARBON NANOTUBE
RING TRANSISTOR. Taishi Shigematsu, Hiroyuki Watanabe,
Chikara Manabe, Kei Shimotani, Masaaki Shimizu, Advanced Research
Lab., Corporate Research Center, Fuji Xerox Co., Ltd., Kanagawa,
JAPAN.
9:00 AM G14.3/NN8.3
TRIPLE-PROBE ATOMIC FORCE MICROSCOPE: MEASURING A CARBON NANOTUBE/DNA
MIS-FET. Kei Shimotani, Hiroyuki Watanabe, Taishi Shigematsu,
Chikara Manabe, Masaaki Shimizu, Advanced Research Lab., Corporate
Research Center, Fuji Xerox Co., Ltd., Kanagawa, JAPAN.
9:15 AM G14.4/NN8.4
TEXTURE-CONTROLLED ELECTROCHEMICAL GROWTH AND CHARACTERIZATION
OF METALLIC NANOWIRES. Mingliang Tian, Jinguo Wang, James
Kurtz, Thomas E. Mallouk, and Moses H.W. Chan, Penn State Univ,
Center for Collective Phenomena in Restricted Geometries, and
the Materials Research Institute, University Park, PA.
9:30 AM G14.5/NN8.5
DYNAMICAL EVOLUTION OF GOLD NANOWIRE FORMATION. Pablo Z. Coura,
Socrates de O. Dantas, Univ. Fed. de Juiz de Fora, Departamento
de Física, Juiz de Fora, BRAZIL; Douglas S. Galvao, UNICAMP,
Instituto de Física Gleb Wataghin, Campinas, BRAZIL; Varlei
Rodrigues, Daniel Ugarte, Laboratório Nacional de Luz Síncrotron,
Campinas, BRAZIL.
9:45 AM G14.6/NN8.6
THE ROLE OF CARBON CONTAMINATION IN SUSPENDED GOLD NANOWIRES.
Sergio B. Legoas, Douglas S. Galvao, Applied Physics Department,
State University of Campinas, Campinas, SP, BRAZIL; Varlei Rodrigues,
Daniel Ugarte, Laboratorio Nacional de Luz Sincrotron, Campinas,
SP, BRAZIL.
10:00 AM BREAK
10:30 AM G14.7/NN8.7
FIELD EMISSION FROM PEAPODS (FILLED SINGLE WALL CARBON NANOTUBE
SYSTEMS). Richard M. Russo, Siddhartha Kar, Christine Sung,
David E. Luzzi, Dept of Materials Science and Engineering, University
of Pennsylvania, Philadelphia, PA.
10:45 AM G14.8/NN8.8
EFFECTS OF SINGLE-WALLED CARBON NANOTUBES ON THE CHARGE TRANSPORT
PROPERTIES OF POLYFLUORENE DERIVATIVE POLYMERS. H. Lu,
S. Webster, L. Zheng, R. Czerw, J. Ballato, D.L. Carroll, Clemson
Univ, Dept of Materials Science and Engineering, Clemson, SC.
SESSION G15: PROCESSING AND PROPERTIES OF HETEROGENEOUS NANOSTRUCTURES
Chair: Andrew P. Shreve
Friday Morning, December 6, 2002
Room 200 (Hynes)
11:00 AM G15.1
TEM STUDY OF RADIATION-INDUCED NANOPHASE FORMATION IN SOLIDS.
L.M. Wang and R.C. Ewing, Department of Nuclear Engineering
and Radiological Sciences, The University of Michigan, Ann Arbor,
MI.
11:15 AM G15.2
MICROSTRUCTURE OF PRECIPITATED Au NANOCLUSTERS IN SINGLE CRYSTAL
MgO. C.M. Wang, S. Thevuthasan, V. Shutthanandan, A. Cavanagh,
J. Walton, W. Jiang, W.J. Weber, and L.E. Thomas, Pacific Northwest
National Laboratory, Richland, WA; L.M. Wang and J. Lian, Department
of Nuclear Engineering and Radiological Sciences, The University
of Michigan, Ann Arbor, MI.
11:30 AM G15.3
QUANTITATIVE MORPHOLOGY OF ALUMINUM SILICATE NANOAGGREGATES. Giovanni
F. Crosta, Department of Environmental Sciences, University
of MI-Bicocca, Milan, ITALY; Changmo Sung, Bongwoo Kang, Carolina
Ospina, Center for Advanced Materials, University of Massachusetts-Lowell,
Lowell, MA; Peter J. Stenhouse, U.S. Army Natick Soldier Center,
Natick, MA.
11:45 AM G15.4
SYNTHESIS, CHARACTERIZATION AND CATALYTIC APPLICATION OF METAL
DOPED NANOPOROUS CARBON. Ponnaiyan Ayyappan and Henry C.
Foley, Dept of Chemical Engineering, University Park, PA.